Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Liu, Chun Jung"'
Publikováno v:
American Annals of the Deaf, 2021 Oct 01. 166(4), 478-500.
Externí odkaz:
https://www.jstor.org/stable/27113323
Publikováno v:
Deafness & Education International; Mar2024, Vol. 26 Issue 1, p37-57, 21p
Publikováno v:
Journal of Deaf Studies and Deaf Education, 2016 Oct 01. 21(4), 362-372.
Externí odkaz:
https://www.jstor.org/stable/26372315
Publikováno v:
American Annals of the Deaf, 2016 Apr 01. 161(1), 67-88.
Externí odkaz:
https://www.jstor.org/stable/26235252
Publikováno v:
Deaf Education Beyond the Western World : Context, Challenges, and Prospects, 2019.
Externí odkaz:
https://doi.org/10.1093/oso/9780190880514.003.0013
Autor:
LIU, CHUN-JUNG, 劉鈞榮
105
The thesis proposes dual slope current input ADC with an on-wafer wide-dynamic range applied in Wafer acceptance test (WAT) in order to measure current of device under test (DUT). The dual slope current input ADC combines two methods (voltag
The thesis proposes dual slope current input ADC with an on-wafer wide-dynamic range applied in Wafer acceptance test (WAT) in order to measure current of device under test (DUT). The dual slope current input ADC combines two methods (voltag
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/89624086010258558693
Akademický článek
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Autor:
LIU, CHUN-JUNG
In IC foundry business, capacity is the most important task for company to maintain their competitiveness. Since the IC foundry is such a capital- intensive business and capacity expansion is the major capital expense for IC foundry. In last 20 years
Publikováno v:
Deafness & Education International; Mar2014, Vol. 16 Issue 1, p2-22, 21p, 2 Color Photographs, 2 Black and White Photographs, 1 Chart