Integration of HP BASIC/UX drivers in IC-MS

Autor: Lippe, K., Wieman, S., Kerkhoff, Hans G.

Publikováno v: Proceedings of the 1st Combined European Hewlett Packard HP4062 & IC-CAP User Meeting, 161-164
STARTPAGE=161;ENDPAGE=164;TITLE=Proceedings of the 1st Combined European Hewlett Packard HP4062 & IC-CAP User Meeting

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::4f8035929359c582d2911398941eb528
https://research.utwente.nl/en/publications/integration-of-hp-basicux-drivers-in-icms(085ca0a7-5aa2-429d-8878-4f92757b96e2).html

Micro-System Characterization and Debugging

Autor: Lippe, K., de Vries, Hendrikus, Kerkhoff, Hans G.

Publikováno v: FOM Werkgemeenschap Halfgeleiders 1993

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::42492a96872738ce4e4b3488e37f2dee
https://research.utwente.nl/en/publications/microsystem-characterization-and-debugging(334bf5e7-53a9-4fb4-8ec0-f2fc2e205554).html

The Application of the HP82000 for the Characterization of a VIPMOS EEPROM Cell

Autor: Lippe, K., Voogel, M.L., Kerkhoff, Hans G.

Publikováno v: Proceedings 1993 HP82000 European User Group Meeting, 1-7
STARTPAGE=1;ENDPAGE=7;TITLE=Proceedings 1993 HP82000 European User Group Meeting

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::56469ad8149b11355baf1c0089ab5397
https://research.utwente.nl/en/publications/the-application-of-the-hp82000-for-the-characterization-of-a-vipmos-eeprom-cell(82778ba1-73b1-4108-8738-3e9ebdbfa90b).html

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Oberflächenpotenzialverlauf von Aspergillus-niger-Sporen in Anwesenheit von mehrwertigen Ionen.

Autor: Lippe, K.¹, Wargenau, A.¹, Kampen, I.¹, Kwade, A.¹

Publikováno v: Chemie Ingenieur Technik (CIT). Sep2014, Vol. 86 Issue 9, p1473-1473. 1p.