X-ray Holographic Microscopy via Photoresist Recording and Atomic-force Microscope Readout

Autor: Lindaas, S., Howells, M., Jacobsen, C., Kalinovsky, A.

Publikováno v: Lindaas, S.; Howells, M.; Jacobsen, C.; & Kalinovsky, A.(1995). X-ray Holographic Microscopy via Photoresist Recording and Atomic-force Microscope Readout. Journal of the Optical Society of America A, 13(9). Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/2qj315pj

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::916f00f6106b7b47280bb1f1fd00fd5e
http://www.escholarship.org/uc/item/2qj315pj

Measurements of wet metaphase chromosomes in the scanning transmission X-ray microscope.

Autor: WILLIAMS, S., ZHANG, X., JACOBSEN, C., KIRZ, J., LINDAAS, S., HOF, J., LAMM, S. S.

Publikováno v: Journal of Microscopy; 1993, Vol. 170 Issue 2, p155-165, 11p

Soft x-ray microscopy with coherent x rays (invited).

Autor: Kirz, J., Ade, H., Jacobsen, C., Ko, C.-H., Lindaas, S., McNulty, I., Sayre, D., Williams, S., Zhang, X., Howells, M.

Publikováno v: Review of Scientific Instruments; Jan1992, Vol. 63 Issue 1, p557, 7p

Coherent Radiation for X-Ray Imaging—The Soft X-Ray Undulator and the X1A Beamline at the NSLS

Autor: Rarback, H., Buckley, C., Ade, H., Camilo, F., DiGennaro, R., Hellman, S., Howells, M., Iskander, N., Jacobsen, C., Kirz, J., Krinsky, S., Lindaas, S., McNulty, I., Oversluizen, M., Sayre, D., Sharnoff, M.

Publikováno v: Journal of X-Ray Science and Technology; January 1990, Vol. 2 Issue: 4 p274-296, 23p

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