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pro vyhledávání: '"Linda Schillinger"'
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VLSI-DAT
With the introduction of FinFET transistors, the Self-Heating Effect (SHE) became a major reliability challenge. In this work, we present an automated SHE estimation method integrated within a circuit reliability framework. It allows designers to stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e01ac4eed2979fed43a6483649166247
https://doi.org/10.1109/vlsi-dat52063.2021.9427356
https://doi.org/10.1109/vlsi-dat52063.2021.9427356
