Quantifying thermal transport in buried semiconductor nanostructures via cross-sectional scanning thermal microscopy

Autor: Alexandros El Sachat, Charalambos Evangeli, Oleg Kolosov, Alexander J. Robson, Clivia M. Sotomayor Torres, Jörg Schulze, Jean Spiece, Francesc Alzina, Miquel Garriga, M. Isabel Alonso, Benjamin J. Robinson, Linda Haenel, Michael Oehme

Publikováno v: Digital.CSIC. Repositorio Institucional del CSIC
instname
Digital.CSIC: Repositorio Institucional del CSIC
Consejo Superior de Investigaciones Científicas (CSIC)
Nanoscale

Managing thermal transport in nanostructures became a major challenge in the development of active microelectronic, optoelectronic and thermoelectric devices, stalling the famous Moore's law of clock speed increase of microprocessors for more than a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::488b53daace74f4dcccfaa4c22b888c8
https://doi.org/10.1039/d0nr08768h