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pro vyhledávání: '"Lin Tsu-Ching"'
Autor:
Lin Tsu-Ching, 林子敬
102
Copper thin films have been grown on glass substrates by DC diode planar sputter and molecular beam epitaxy (MBE). The as-grown Cu films have been examined by atomic force microscopy. A positive correlation between the roughness and the thic
Copper thin films have been grown on glass substrates by DC diode planar sputter and molecular beam epitaxy (MBE). The as-grown Cu films have been examined by atomic force microscopy. A positive correlation between the roughness and the thic
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/4h636g
