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pro vyhledávání: '"Lin Juan Deng"'
Publikováno v:
Applied Mechanics and Materials. :904-910
White light interference technique for topography measurement effectively avoids phase ambiguity in phase-shifting interferometry. The spatial frequency domain algorithm based on scanning white light interference technique has the advantage of insens
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77a7dc1de3710724433c6006731aef36
https://doi.org/10.4028/www.scientific.net/amm.738-739.904
https://doi.org/10.4028/www.scientific.net/amm.738-739.904
