Zobrazeno 1 - 10
of 80
pro vyhledávání: '"Lin, Zichao"'
Autor:
Gu, Zhenjie, Xie, Zhangning, Chang, Zhikun, Xiao, Guangxu, Yin, Zhijun, Lin, Zichao, Zhou, Tong, Lei, Lihua, Jin, Tao, Xue, Dongbai, Deng, Xiao, Chen, Xinbin, Li, Tongbao
Traceability of precision instrument and measuring method is the core issue in metrology science. In the field of nanometer length measurement, the laser interferometers are usually used to trace the measurement value to the laser wavelength, but the
Externí odkaz:
http://arxiv.org/abs/2306.14146
Autor:
Lin, Zichao, Yao, Yulin, Xie, Zhangning, Xue, Dongbai, Zhou, Tong, Tang, Zhaohui, Lei, Lihua, Jin, Tao, Dun, Xiong, Deng, Xiao, Cheng, Xinbin, Li, Tongbao
Natural constant-based metrology methods offer an effective approach to achieving traceability in nanometric measurements. The Cr grating, fabricated by atom lithography and featuring a pitch of $d=212.7705\pm0.0049~{\rm nm}$ traceable to the Cr tran
Externí odkaz:
http://arxiv.org/abs/2306.14083
Autor:
Deng, Xiao, Lin, Zichao, Dai, Gaoliang, Tang, Zhaohui, Xie, Zhangning, Xiao, Guangxu, Yin, Zhijun, Lei, Lihua, Jin, Tao, Xue, Dongbai, Gu, Zhenjie, Cheng, Xinbin, Li, Tongbao
Precise positioning measurement plays an important role in in today advanced manufacturing industry, and length traceability chain has been optimizing and enriching to fulfill the developing and various precise positioning requirement. In this paper,
Externí odkaz:
http://arxiv.org/abs/2302.14633
Recently, knowledge-enhanced methods leveraging auxiliary knowledge graphs have emerged in relation extraction, surpassing traditional text-based approaches. However, to our best knowledge, there is currently no public dataset available that encompas
Externí odkaz:
http://arxiv.org/abs/2210.11231
Autor:
Wang, Fudi, Lu, Dian, Gu, Mingfeng, Jin, Yifei, Fu, Jia, Shi, Yuejiang, Yang, Yang, Rice, J. E., Bitter, Manfred, Zang, Qing, Zhao, Hailin, He, Liang, Li, Miaohui, Xu, Handong, Liu, Haijing, Lin, Zichao, Chen, Yifei, Shen, Yongcai, Hill, Kenneth, Bae, Cheonho, Fu, Shengyu, Zhang, Hongming, Lee, Sanggon, Yang, Xiaoqing, Jia, Guozhang, Li, Yingying, Lyu, Bo, Huang, Juan, Gong, Xianzu, Wan, Baonian
New high-resolution x-ray spectra of Mo39+, Mo40+, W43+, W44+ and W45+ have been carefully confirmed for the first time by use of the x-ray imaging crystal spectrometer (XCS) in Experimental Advanced Superconducting Tokamak (EAST) under various combi
Externí odkaz:
http://arxiv.org/abs/2204.02051
Autor:
Lin, Zichao, Deng, Xiao, Wu, Yize, Feng, Jingtong, Zhu, Hongyu, Yang, Yaao, Yu, Jing, Xue, Dongbai, Wang, Jianbo, Shi, Yushu, Jin, Tao, Zhang, Wentao, Dun, Xiong, Cheng, Xinbin, Li, Tongbao
Publikováno v:
In Measurement January 2025 242 Part A
Publikováno v:
In Computers and Electronics in Agriculture May 2024 220
Autor:
Lin, Zichao, Yao, Yulin, Xie, Zhangning, Xue, Dongbai, Zhou, Tong, Tang, Zhaohui, Lei, Lihua, Jin, Tao, Dun, Xiong, Deng, Xiao, Cheng, Xinbin, Li, Tongbao
Publikováno v:
In Precision Engineering March 2024 86:285-293
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Akademický článek
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