Stoichiometric SiO 2 thin films deposited by reactive sputtering

Autor: Radović, I., Serruys, Y., Limoge, Y., Bibić, N., Poissonnet, S., Jaoul, O., Mitrić, M., Romčević, N., Milosavljević, M.

Publikováno v: In Materials Chemistry and Physics 2007 104(1):172-176

Study of self-limiting oxidation of silicon nanoclusters by atomistic simulations.

Autor: Dalla Torre, J., Bocquet, J.-L., Limoge, Y., Crocombette, J.-P., Adam, E., Martin, G., Baron, T., Rivallin, P., Mur, P.

Publikováno v: Journal of Applied Physics; 7/15/2002, Vol. 92 Issue 2, p1084, 11p, 4 Diagrams, 7 Graphs

Diffusion in Solids

Autor: Bénière, F. ^a, Bocquet, J.L. ^b, Brébec, G. ^b, Limoge, Y. ^b

Publikováno v: In Encyclopedia of Materials: Science and Technology 2011:2159-2170

Analysis of SiO2 thin film deposited by reactive sputtering

Autor: Radović, Ivan, Serruys, Y., Limoge, Y., Jaoul, O., Romčević, Nebojša Ž., Poissonnet, S., Bibić, Nataša M.

Publikováno v: Materials Science Forum

SiO2 layers were deposited by reactive d.c ion sputtering (using 1 keV Ar+ ion gun) from a high purity silicon target in an oxygen ambient. The base pressure in the deposition chamber was 4.7-10(-9) mbar, and the substrate temperature was held at 550

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______4175::d3c4fa07c801f8734e65c9ce699130b1
https://vinar.vin.bg.ac.rs/handle/123456789/6599

Reaction and diffusion in multiphase systems : phenomenology and frames

Autor: Loo, van, F.J.J., Pieraggi, B., Limoge, Y., Bocquet, J.L.

Publikováno v: Reactive phase formation at interfaces and diffusion processes : proceedings of the international meeting held in Aussois (France), 307-318
STARTPAGE=307;ENDPAGE=318;TITLE=Reactive phase formation at interfaces and diffusion processes : proceedings of the international meeting held in Aussois (France)

The Kirkendall effect is well-known and documented for the diffusion in a single-phased substitutional solid soln. Also in multiphased systems, much exptl. evidences for the occurrence of the Kirkendall effect can also be found in the literature. How

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::260b423355b5e060e3dab1c1040095cc
https://research.tue.nl/nl/publications/acf2d552-8088-4f4b-8c16-cafab4753e5c