Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Lilian M. Vogl"'
Publikováno v:
Advanced Materials Interfaces, Vol 11, Iss 13, Pp n/a-n/a (2024)
Abstract Atomic layer deposition (ALD) is one of the premier methods to synthesize ultra‐thin materials on complex surfaces. The technique allows for precise control of the thickness down to single atomic layers, while at the same time providing un
Externí odkaz:
https://doaj.org/article/cc7da8916cff471d80fc6d6e531a56e4
Publikováno v:
Microscopy and Microanalysis. 28:1892-1894
Publikováno v:
ACS nano. 16(11)
Modern devices based on modular designs require versatile and universal sensor components which provide an efficient, sensitive, and compact measurement unit. To improve the space capacity of devices, miniaturized building elements are needed, which
Publikováno v:
MRS Advances. 6:665-673
Abstract Size effects decisively influence the properties of materials at small length scales. In the context of mechanical properties, the trend of ‘smaller is stronger’ has been well established. This statement refers to an almost universal tre
Autor:
Martin Marz, Andreas Hutzler, Erdmann Spiecker, Mingjian Wu, Birk Fritsch, Michael P. M. Jank, Lilian M. Vogl
Publikováno v:
Microscopy and Microanalysis. 27:1040-1042
Publikováno v:
Nanoscale. 11:11687-11695
A new in situ synthesis method for the growth of MoO2 nanowires via controlled thermal oxidation of MoS2 flakes is presented, going from a 2D transition metal chalcogenide to a transition metal oxide nanostructure. The wire growth is performed under
Publikováno v:
Nanoscale. 11(24)
A new in situ synthesis method for the growth of MoO2 nanowires via controlled thermal oxidation of MoS2 flakes is presented, going from a 2D transition metal chalcogenide to a transition metal oxide nanostructure. The wire growth is performed under
Autor:
Schweizer, Peter, Pethö, Laszlo, Huszár, Emese, Vogl, Lilian M., Michler, Johann, Maeder, Xavier
Publikováno v:
Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p1892-1894, 3p
Publikováno v:
Advanced Materials Interfaces; May2024, Vol. 11 Issue 13, p1-7, 7p
Publikováno v:
Nanoscale; 6/28/2019, Vol. 11 Issue 24, p11385-11401, 17p