Zobrazeno 1 - 10
of 586
pro vyhledávání: '"Lidow, A."'
Autor:
Zhang, Shengke, Gajare, Siddhesh, Garcia, Ricardo, Huang, Sijun, Espinoza, Angel, Gorgerino, Andrea, Zhang, Ruizhe, Pozo, Alejandro, Strittmatter, Robert, Lidow, Alex
Publikováno v:
In Power Electronic Devices and Components October 2023 6
Autor:
Shengke Zhang, Siddhesh Gajare, Ricardo Garcia, Sijun Huang, Angel Espinoza, Andrea Gorgerino, Ruizhe Zhang, Alejandro Pozo, Robert Strittmatter, Alex Lidow
Publikováno v:
Power Electronic Devices and Components, Vol 6, Iss , Pp 100051- (2023)
DC-DC converters exist in virtually every application of modern power electronics. Due to small die size, low on-resistance, and low parasitic capacitance, GaN power devices offer superior conversion efficiency and record-setting power density. In th
Externí odkaz:
https://doaj.org/article/5ea694be56e6416794691011fe9a064d
Autor:
Lidow, Derek Balfour
Publikováno v:
Journal of Management History, 2022, Vol. 28, Issue 4, pp. 458-475.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/JMH-11-2021-0058
Autor:
LIDOW, DEREK
Publikováno v:
Harvard Business Review. Spring2023 Special issue, p106-108. 3p. 1 Color Photograph, 1 Diagram.
Autor:
Koh, Phil Ok, Undie, Ashiwel S., Kabbani, Nadine, Levenson, Robert, Goldman-Rakic, Patricia S., Lidow, Michael S.
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America, 2003 Jan 01. 100(1), 313-317.
Externí odkaz:
https://www.jstor.org/stable/3074152
Autor:
Derek Balfour Lidow
Publikováno v:
Journal of Management History. 28:458-475
Purpose This paper aims to derive a time and place invariant definition of entrepreneurship necessary for the identification of prehistoric entrepreneurial behavior. Design/methodology/approach The definition was derived by correlating a diverse set
Autor:
Johnson, Tim, Lidow, Nicholai
Publikováno v:
Armed Forces & Society, 2016 Apr 01. 42(2), 436-448.
Externí odkaz:
https://www.jstor.org/stable/48670255
Publikováno v:
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC).
Publikováno v:
IEEE Power Electronics Magazine. 7:28-35
Standard qualification testing for semiconductors typically involves stressing devices at-or-near the limits specified in their data sheets for a prolonged period of time, or for a certain number of cycles. The goal of qualification testing is to hav