Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Libor, Strakos"'
Autor:
P. Lagrain, Thomas Hantschel, Clement Porret, Tomas Vystavel, Roger Loo, Libor Strakos, Han Han, Marina Baryshnikova, Bernardette Kunert
Publikováno v:
International Symposium for Testing and Failure Analysis.
Although the physical limits of CMOS scaling should have been reached years ago, the process is still ongoing due to continuous improvements in material quality and analytical techniques. This paper describes one such technique, electron channeling c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aad91065a75252f3a486183c2451f8ef
https://doi.org/10.31399/asm.cp.istfa2021p0211
https://doi.org/10.31399/asm.cp.istfa2021p0211
Autor:
Han, Han, Libor, Strakos, Thomas, Hantschel, Clement, Porret, Tomas, Vystavel, Roger, Loo, Matty, Caymax
Publikováno v:
Micron (Oxford, England : 1993). 150
Electron channeling contrast imaging (ECCI) is a powerful technique to characterize the structural defects present in a sample and to obtain relevant statistics about their density. Using ECCI, such defects can only be properly visualized, if the inf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::48137b867e5bfccc084d809424fa3efb
https://pubmed.ncbi.nlm.nih.gov/34343885
https://pubmed.ncbi.nlm.nih.gov/34343885
Autor:
Antoine Pacco, Nadine Collaert, Andreas Schulze, Matty Caymax, Libor Strakos, Wilfried Vandervorst, Roger Loo, Tomas Vystavel
Publikováno v:
Nanoscale. 10:7058-7066
Semiconductor heterostructures are at the heart of most nanoelectronic and photonic devices such as advanced transistors, lasers, light emitting diodes, optical modulators and photo-detectors. However, the performance and reliability of the respectiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::669a008316fd2b9afd79c7e8297e9b4e
https://doi.org/10.1039/c8nr00186c
https://doi.org/10.1039/c8nr00186c
Autor:
Libor Strakos, Thomas Hantschel, Han Han, Roger Loo, Matty Caymax, Clement Porret, Tomas Vystavel
Publikováno v:
Micron. 150:103123
Electron channeling contrast imaging (ECCI) is a powerful technique to characterize the structural defects present in a sample and to obtain relevant statistics about their density. Using ECCI, such defects can only be properly visualized, if the inf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce099b40e1e05bcb51b188a0f0da8b78
https://doi.org/10.1016/j.micron.2021.103123
https://doi.org/10.1016/j.micron.2021.103123
Autor:
Roger Loo, Andreas Schulze, Tomas Vystavel, Wilfried Vandervorst, Matty Caymax, Robert Langer, Thomas Hantschel, Bernardette Kunert, Libor Strakos, Han Han
Publikováno v:
Ultramicroscopy. 210:112922
In this study, an annular multi-segment backscattered electron (BSE) detector is used in back scatter geometry to investigate the influence of the angular distribution of BSE on the crystalline defect contrast in electron channeling contrast imaging
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::35d7017e586c95f69c27c3022b88cbe6
https://doi.org/10.1016/j.ultramic.2019.112922
https://doi.org/10.1016/j.ultramic.2019.112922
Autor:
Tomas Vystavel, Richard Young, Han Han, Matty Caymax, Libor Strakos, Ondrej Machek, Andreas Schulze
Publikováno v:
International Symposium for Testing and Failure Analysis.
As semiconductor devices continue to shrink, novel materials (e.g. (Si)Ge, III/V) are being tested and incorporated to boost device performance. Such materials are difficult to grow on Si wafers without forming crystalline defects due to lattice mism
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::060ea1fa752e3dd8d6adca48e3ad7c40
https://doi.org/10.31399/asm.cp.istfa2018p0363
https://doi.org/10.31399/asm.cp.istfa2018p0363
Autor:
Tomáš Vystavěl, Jaroslav Stárek, Thomas Hantschel, Pavel Stejskal, Anna Prokhodtseva, Libor Strakos, Han Han
Publikováno v:
Microscopy and Microanalysis. 25:508-509
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ac008dddb675796f49451bff6546820
https://doi.org/10.1017/s1431927619003271
https://doi.org/10.1017/s1431927619003271
Autor:
John Mitchels, Miloš Hovorka, Tomas Vystavel, Tim Dahmen, Faysal Boughorbel, B Lich, Patrick Trampert, Libor Strakos, Pavel Potocek
Publikováno v:
Microscopy and Microanalysis. 23:150-151
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a069fa888e7d8a82e2f8756b155e292
https://doi.org/10.1017/s143192761700143x
https://doi.org/10.1017/s143192761700143x
Autor:
Andreas Schulze, Han Han, Libor Strakos, Tomas Vystavel, Clement Porret, Roger Loo, Matty Caymax
Publikováno v:
ECS Meeting Abstracts. :1069-1069
The most recent wave of digital transformation reshapes nearly all aspects of human society and is currently driven by innovations in areas such as AI and machine learning, AR/VR, autonomous driving, cloud and edge computing, 5G etc. All of these app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c9615207ef56d8aa39b62298394fe8d
https://doi.org/10.1149/ma2018-02/31/1069
https://doi.org/10.1149/ma2018-02/31/1069