Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Liangzhen Cha"'
Publikováno v:
Surface and Interface Analysis. 52:249-255
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2acda20294746b69c4be357c5c1830f
https://doi.org/10.1002/sia.6725
https://doi.org/10.1002/sia.6725
Publikováno v:
In Applied Surface Science 2003 203:441-444
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:1568-1571
Materials surface properties were improved by the application of a rf glow discharge treatment for vacuum and electronic applications. The surface morphology was studied under different glow discharge treatments and it could be shown by experiments t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db551fd4799ad47daae88e36b33eb388
https://doi.org/10.1116/1.2197507
https://doi.org/10.1116/1.2197507
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:91-94
One must do ultrasensitive leak detection during ultrahigh-vacuum (UHV) evacuation, especially just before the device is sealed off from the vacuum system, to guarantee the longevity of the sealed high-vacuum or even UHV devices with small volume. A
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e31477a1679f24dfaa94fee49c1cbee
https://doi.org/10.1116/1.2137330
https://doi.org/10.1116/1.2137330
Publikováno v:
Vacuum. 81:257-259
A variable reference leak rate system is developed for real time calibration of ultrasensitive leak detection. It is based on the molecular flow characteristics of the platinum wire-glass leak element combined with a helium pressure adjustable device
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c22407d9516e505af23d9b734b255d12
https://doi.org/10.1016/j.vacuum.2005.11.074
https://doi.org/10.1016/j.vacuum.2005.11.074
Publikováno v:
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jan2006, Vol. 24 Issue 1, p91-94, 4p, 1 Diagram, 6 Graphs
Publikováno v:
Surface & Interface Analysis: SIA; 2001, Vol. 32 Issue 1, p171-174, 4p
Publikováno v:
Surface and Interface Analysis; August 2001, Vol. 32 Issue: 1 p171-174, 4p
Publikováno v:
Surface and Interface Analysis; August 2001, Vol. 32 Issue: 1 p171-174, 4p
Publikováno v:
Springer Series in Chemical Physics ISBN: 9783642827266
Increasing the overall transmission of a secondary ion-analyzing system is the key to enhancing the sensitivity of SIMS. Secondary ion energy distribution can provide us with much useful information. In order to do high sensitivity SIMS work and to s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad65cbcf6fab7fd516d1b9eb54296634
https://doi.org/10.1007/978-3-642-82724-2_41
https://doi.org/10.1007/978-3-642-82724-2_41
