Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Lianchao Sun"'
Autor:
Ping Hou, Lianchao Sun
Publikováno v:
Thin Solid Films. :525-529
Spectroscopic ellipsometry (SE) was applied to study the optical inhomogeneity of TiO2 films deposited by the technique of ion-beam assisted e-beam evaporation. A three-sub-layer model of ellipsometry analysis can successfully simulate the structure
Autor:
James E. Crocker, Shay Harrison, Harris L. Marcus, Leon L. Shaw, Lianchao Sun, Kevin J. Jakubenas
Publikováno v:
Materials and Manufacturing Processes. 13:909-919
Fabrication of a SiC/C thermocouple embedded in an arbitrarily-shaped SiC macro-component has been demonstrated using an integrated Selective Area Laser Deposition (SALD) with the closely related Selective Area Laser Deposition Vapor Infiltration (SA
Autor:
Leon L. Shaw, James E. Crocker, Harris L. Marcus, Shay Harrison, Kevin J. Jakubenas, Lianchao Sun
Publikováno v:
Materials and Manufacturing Processes. 13:859-882
To fabricate macro-structural SiC components containing an In Situ SiC/C thermocouple using an integrated SALD and SALDVI technique, thermodynamic analyses on the involved reactant gases have been performed with the CET89 code based on the minimizati
Autor:
James E. Crocker, Shay Harrison, Kevin J. Jakubenas, Lianchao Sun, Leon L. Shaw, Harris L. Marcus
Publikováno v:
Materials and Manufacturing Processes. 13:883-907
In order to fabricate well-control led in situ SiC/C thermocouples embedded within macro-structural SiC components using an integrated selective area laser deposition (SALD) and the selective area laser deposition and vapor Infiltration (SALDVI) tech
Autor:
Lianchao Sun, Leon L. Shaw
Publikováno v:
Metallurgical and Materials Transactions A. 30:2549-2551
Publikováno v:
JOM. 50:21-23
Selective-area laser deposition and selective-area laser-deposition vapor infiltration are two gas-phase solid-freeform techniques capable of the direct fabrication of arbitrary structures. The wide range of available gas precursors allows unique com
Autor:
Lianchao Sun, Ping Hou
Publikováno v:
SPIE Proceedings.
Nondestructive characterization on thin films and their stack in MOEMS device is highly desirable. But, it is often a challenging task because the area is usually small. During processing of thin films, the deposition rates, optical properties, and m
Publikováno v:
MRS Proceedings. 854
Optical thin films with SiO2-TiO2 stack were prepared by the technology of electron beam (e-beam) evaporation with ion beam assistant deposition (IBAD). The mechanical (stress) and optical properties of as-deposited thin films were studied as a funct
Autor:
Lianchao Sun, Ping Hou
Publikováno v:
MRS Proceedings. 795
Control of the film stress and optical property has long been considered as an issue in the tunable optical MEMS (Micro-Electro-Mechanical Systems) devices. In this paper, the atmospheric evolution of Titanium Dioxide (TiO2) and Silicon Dioxide (SiO2
Autor:
Jean-Claude Fouere, Lianchao Sun
Publikováno v:
MRS Proceedings. 786
Further improvements in CMOS circuit performance such as switching speed and power reduction will rely on the use of silicon on insulator (SOI) substrates with decreased functional layer thicknesses. According to the International Technology Roadmap