Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Li-Chen Chu"'
Autor:
Li-Chen Chu, 朱勵晨
103
GaN-based light emitting diodes (LEDs) reliability tests are crucial to further development for high performance LED lighting technology. In this study, we perform reverse-bias stress and forward-bias stress tests for LEDs in water vapor and
GaN-based light emitting diodes (LEDs) reliability tests are crucial to further development for high performance LED lighting technology. In this study, we perform reverse-bias stress and forward-bias stress tests for LEDs in water vapor and
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/78995908050999459207
Publikováno v:
Environmental Earth Sciences. 80
To understand the effect of organic acid on the solubility of feldspar under high temperature conditions, feldspar dissolution experiments in oxalic acid and in acetic acid were conducted at 130 °C. And the Gaussian simulation software was used to c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc58966292fb8a78593c74117b4ab771
https://doi.org/10.1007/s12665-021-09537-2
https://doi.org/10.1007/s12665-021-09537-2
Akademický článek
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Akademický článek
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Publikováno v:
Journal of New Materials for Electrochemical Systems. 19:007-010
Forward-bias stress in salty water vapor can quickly degrade the InGaN/GaN LEDs. To examine the weakness of the device, electrical, optical, and material analyses and characterizations were performed to investigate the failure mechanism. Corrosion of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93450dcc4e79095ba072aabf615fe2bb
https://doi.org/10.14447/jnmes.v19i1.340
https://doi.org/10.14447/jnmes.v19i1.340
Autor:
Sheng Hsin Wang, Chian You Chen, Ming Ling Lee, Li Chen Chu, Yun Ti Chen, Hsiang Chen, Kow Ming Chang, Chin Pang Chen
Publikováno v:
Vacuum. 118:90-93
Cobalt (Co) nanoparticles (NPs) are spread on ZnO nanorods (NRs) on a polished Ti substrate. To characterize the Co NPs on the ZnO NRs, multiple material analyses including field-emission scanning electron microscope (FESEM), energy dispersive X-ray
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63a4ceab86dfec0416ebf64b693f3ba7
https://doi.org/10.1016/j.vacuum.2015.01.026
https://doi.org/10.1016/j.vacuum.2015.01.026
Autor:
Huan Yu Shen, Chin Pang Chen, Hsiang Chen, Hung Wei Chang, Li Chen Chu, Yu Cheng Chu, Nai Chung Kang, Ming Ling Lee, Kow-Ming Chang, Shih-Chang Shei
Publikováno v:
Vacuum. 118:13-16
GaP-based light emitting diodes (LEDs) reliability tests are crucial to further development for high-performance LED lighting technology. In this study, we perform reverse-bias stress tests for LEDs in water vapor and salty water vapor ambient, respe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3fb3fed5d27c7b5940f618bf552451fa
https://doi.org/10.1016/j.vacuum.2014.11.004
https://doi.org/10.1016/j.vacuum.2014.11.004
Publikováno v:
Asian Journal of Empirical Research. 4(1):1-17
The global prevalence of the Internet has effectively overcome the intangible limits of physical distance while elevating consumers’ inclination to engage in online shopping. Online group buying is now extremely popular during the bleak econom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______645::0cbeb7b70388664e31c2e2a057d7c24a
http://www.aessweb.com/journals/5004/January2014
http://www.aessweb.com/journals/5004/January2014
Autor:
Yun Ti Chen, Sheng-Ting Huang, Yih-Min Yeh, Chian You Chen, Li-Chen Chu, Ren Guei Ueng, Hsiang Chen, Hsi-Wen Yu, Sheng-Hsin Wang
Publikováno v:
Journal of New Materials for Electrochemical Systems. 17:045-048
In this research, we grew a ZnO film as a buffer layer on indium tin oxide (ITO) substrates and CuInSe2/ITO (CIS/ITO) substrates by electrochemical deposition. To examine material quality of ZnO films, multiple material and optical analyses including
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b730b6d274b905b4c2b5487fc64fbb9d
https://doi.org/10.14447/jnmes.v17i1.443
https://doi.org/10.14447/jnmes.v17i1.443
Autor:
Hsiang Chen, Yih-Min Yeh, Yun Ti Chen, Chian You Chen, Sheng-Hsin Wang, Li-Chen Chu, Ren Guei Ueng, Hsi-Wen Yu, Sheng-Ting Huang
Publikováno v:
Journal of New Materials for Electrochemical Systems; 2014, Vol. 17 Issue 1, p45-48, 4p