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pro vyhledávání: '"Li-C Wang"'
Autor:
Li-C. Wang, Yueling Zeng
Publikováno v:
Machine Learning Support for Fault Diagnosis of System-on-Chip ISBN: 9783031196386
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2e161a4d81fc91c8251e3f9d361d86d
https://doi.org/10.1007/978-3-031-19639-3_9
https://doi.org/10.1007/978-3-031-19639-3_9
Publikováno v:
2022 IEEE International Test Conference (ITC).
Publikováno v:
2022 IEEE International Test Conference in Asia (ITC-Asia).
Publikováno v:
ITC
In this work, we consider learning a wafer plot recognizer where only one training sample is available. We introduce an approach called Manifestation Learning to enable the learning. The underlying technology utilizes the Variational AutoEncoder (VAE
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis aft
Publikováno v:
ITC
A machine learning (ML) solution can be non-robust and when it is deployed, can make mistakes on the future unseen data. Consequently, deployment of a ML solution might demand continuous service from its ML developer. Using wafer image classification
Publikováno v:
ICCAD
Robustness is a key requirement for deploying a machine learning (ML) based solution. When a solution involves a ML model whose robustness is not guaranteed, ensuring robustness of the solution might rely on continuous checking of the ML model for it
Publikováno v:
IEEE Design & Test. 34:7-22
Editor’s note: This paper provides a tutorial overview of the state-of-the-art in verification of complex and heterogeneous Systems-on-Chip. The authors discuss current industrial trends and key research challenges. —Haralampos Stratigopoulos, So
Autor:
Li-C. Wang
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36:885-898
Applying modern data mining in electronic design automation and test has become an area of growing interest in recent years. This paper reviews some of the recent developments in the area. It begins by introducing several key concepts in machine lear