Zobrazeno 1 - 10
of 427
pro vyhledávání: '"Li Jing-wei"'
Autor:
Zhu Kui-song, Cheng Xiang-kui, Lin Yin-he, Zhao Ying-tao, Yin Guo-liang, Li Jing-wei, Wang Jun, Cao Li
Publikováno v:
High Temperature Materials and Processes, Vol 41, Iss 1, Pp 296-305 (2022)
The effect of temperature on phase transformation, metallization rate, carbon residue and agglomeration of metal Fe after the pre-reduction of carbon-containing pellets in high-chromium vanadium–titanium magnetite (HCVTM) was investigated. The resu
Externí odkaz:
https://doaj.org/article/77e13dcff415498bba6ceb6c182c9aa6
Publikováno v:
High Temperature Materials and Processes, Vol 32, Iss 5, Pp 503-510 (2013)
To develop a new method of refining silicon for use in solar cell materials, liquation refining with Al-Si alloying was proposed for purification of metallurgical grade silicon (MG-Si). The morphologies of impurities, especially for phosphorus and ir
Externí odkaz:
https://doaj.org/article/20064eac345641328f0d453ab7569724
Publikováno v:
Tongxin xuebao, Vol 32, Pp 184-190 (2011)
FPE(format-preserving encryption) was discussed,and it was shown that how to reduce domain complexity was the direction of designing FPE modes.A new FPE mode named coding-then-encipher mode was proposed and its operating principle and security we
Externí odkaz:
https://doaj.org/article/6c1bdef8aaed4bfba38f19e550b73b98
Autor:
Yu, Jincheng, Liu, Xiaodong, Hu, Haihua, Jiang, Yilin, Zhuang, Hua-Lu, Li, Hezhang, Su, Bin, Li, Jing-Wei, Han, Zhanran, Wang, Zhengqin, Chen, Lu, Hayashi, Kei, Miyazaki, Yuzuru, Mehdi, B. Layla, Li, Jing-Feng
Publikováno v:
In Joule 18 September 2024 8(9):2652-2666
Si3N4 preparation from photovoltaic kerf loss silicon waste by copper collaborative nitriding method
Autor:
Zha, Hong-kai, Yu, Jing-yang, Li, Jing-wei, Lin, Yin-he, Yu, Wen-qing, Shi, Jian, Fan, Yu-hang, Tang, Wen-ming
Publikováno v:
In Ceramics International 1 August 2024 50(15):26972-26981
Publikováno v:
In Scientia Horticulturae 1 November 2024 337
Autor:
Hu, Haihua, Su, Bin, Liu, Xiaodong, Thong, Hao-Cheng, Jiang, Yilin, Li, Hezhang, Li, Jing-Wei, Zhuang, Hua-Lu, Han, Zhanran, Yu, Jincheng, Mehdi, B. Layla, Li, Jing-Feng
Publikováno v:
In Joule 21 February 2024 8(2):416-429
Autor:
Li, Jing-Wei, Li, Hui, Li, Ying, Feng, Li, Huang, Yu, Zhao, Jie, Lu, Lei, Ying, Bei-Li, Xue, Jian-Chao
Flat-field reflects the non-uniformity of the photometric response at the focal plane of an instrument, which uses digital image sensors, such as Charge Coupled Device (CCD) and Complementary Metal-Oxide-Semiconductor (CMOS). This non-uniformity must
Externí odkaz:
http://arxiv.org/abs/2012.10110
Autor:
Li, Jing-wei, Chen, Yu-zhi, Zhang, Yu, Zeng, Li-hua, Li, Kai-wei, Xie, Bao-zhen, Luo, Song-ping, Gao, Jie
Publikováno v:
In Heliyon December 2023 9(12)
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