Zobrazeno 1 - 10
of 96
pro vyhledávání: '"Li, Tongbao"'
Autor:
Gu, Zhenjie, Xie, Zhangning, Chang, Zhikun, Xiao, Guangxu, Yin, Zhijun, Lin, Zichao, Zhou, Tong, Lei, Lihua, Jin, Tao, Xue, Dongbai, Deng, Xiao, Chen, Xinbin, Li, Tongbao
Traceability of precision instrument and measuring method is the core issue in metrology science. In the field of nanometer length measurement, the laser interferometers are usually used to trace the measurement value to the laser wavelength, but the
Externí odkaz:
http://arxiv.org/abs/2306.14146
Autor:
Lin, Zichao, Yao, Yulin, Xie, Zhangning, Xue, Dongbai, Zhou, Tong, Tang, Zhaohui, Lei, Lihua, Jin, Tao, Dun, Xiong, Deng, Xiao, Cheng, Xinbin, Li, Tongbao
Natural constant-based metrology methods offer an effective approach to achieving traceability in nanometric measurements. The Cr grating, fabricated by atom lithography and featuring a pitch of $d=212.7705\pm0.0049~{\rm nm}$ traceable to the Cr tran
Externí odkaz:
http://arxiv.org/abs/2306.14083
Autor:
Deng, Xiao, Lin, Zichao, Dai, Gaoliang, Tang, Zhaohui, Xie, Zhangning, Xiao, Guangxu, Yin, Zhijun, Lei, Lihua, Jin, Tao, Xue, Dongbai, Gu, Zhenjie, Cheng, Xinbin, Li, Tongbao
Precise positioning measurement plays an important role in in today advanced manufacturing industry, and length traceability chain has been optimizing and enriching to fulfill the developing and various precise positioning requirement. In this paper,
Externí odkaz:
http://arxiv.org/abs/2302.14633
Autor:
Lin, Zichao, Deng, Xiao, Wu, Yize, Feng, Jingtong, Zhu, Hongyu, Yang, Yaao, Yu, Jing, Xue, Dongbai, Wang, Jianbo, Shi, Yushu, Jin, Tao, Zhang, Wentao, Dun, Xiong, Cheng, Xinbin, Li, Tongbao
Publikováno v:
In Measurement January 2025 242 Part A
Autor:
Lin, Zichao, Yao, Yulin, Xie, Zhangning, Xue, Dongbai, Zhou, Tong, Tang, Zhaohui, Lei, Lihua, Jin, Tao, Dun, Xiong, Deng, Xiao, Cheng, Xinbin, Li, Tongbao
Publikováno v:
In Precision Engineering March 2024 86:285-293
Akademický článek
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K zobrazení výsledku je třeba se přihlásit.
Autor:
Tan, Wen, Tang, Zhaohui, Xiao, Guangxu, Yao, Yulin, Lei, Lihua, Li, Qing, Jin, Tao, Deng, Xiao, Cheng, Xinbin, Li, Tongbao
Publikováno v:
In Ultramicroscopy July 2023 249
Autor:
Tang, Zhaohui, Zhao, Jun, Deng, Xiao, Tan, Wen, Wu, Yanqing, Tai, Renzhong, Cheng, Xinbin, Li, Tongbao
Publikováno v:
In Optik May 2023 279
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Deng, Xiao, Dai, Gaoliang, Liu, Jie, Hu, Xiukun, Bergmann, Detlef, Zhao, Jun, Tai, Renzhong, Cai, Xiaoyu, Li, Yuan, Li, Tongbao, Cheng, Xinbin
Publikováno v:
In Ultramicroscopy July 2021 226