Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Lester W. Strock"'
Autor:
George E. Heggen, Lester W. Strock
Publikováno v:
Journal of the Optical Society of America. 37(1)
Autor:
Lester W. Strock
Publikováno v:
Applied Spectroscopy. 8:105-114
Synthetic silicate melts of CaSiOa and CaMg(SiO3)2 and 20 intermediate mixtures were used as standards for Calibrating a spectrochemical analysis method for CaO and MgO by the Ge metal dilution method previously described. The slope of log RET: log C
Autor:
Lester W. Strock
Publikováno v:
Fresenius' Zeitschrift für analytische Chemie. 99:321-335
Autor:
Lester W. Strock
Publikováno v:
Applied Spectroscopy. 23:309-316
The sudden emergence of spectrochemical analysis in this country in the late 1930's and early 1940's cannot be said to have resulted from the discovery of any new basic principles, but was rather a response to needs for information on chemical compos
Autor:
Lester W. Strock
Publikováno v:
Applied Spectroscopy. 7:64-71
Four years ago I presented to the Society for Applied Spectroscopy some preliminary results of a research program designed to develop optical spectrochemical methods for determining major constituents in geological materials. This material was incorp
Autor:
Lester W. Strock
Publikováno v:
Spectrochimica Acta. 1:123-130
The contribution of the “reciprocity failure” to the combined photographic effects which cause the log exposure time ratio : log intensity (concentration) curve (Fig. 6) to depart from a straight line relationship has been derived. A family of sc
Autor:
Lester W. Strock
Publikováno v:
Zeitschrift für Kristallographie - Crystalline Materials. 88:238-247
Autor:
Aslak Kvalheim, Lester W. Strock
Publikováno v:
Spectrochimica Acta. 1:221-226
A spectrochemical method for determining scandium in powdered silicate rocks is described. Photometric density measurements of cathode layer spectra were converted to corresponding log exposure time values by means of a density : log exposure time ca
Autor:
Lester W. Strock
Publikováno v:
Zeitschrift für Kristallographie - Crystalline Materials. 86:186-191