Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Leslie Charles Jenkins"'
Publikováno v:
IBM Journal of Research and Development. 36:59-68
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17cb78e17df655e79d41663188de56bb
https://doi.org/10.1147/rd.361.0059
https://doi.org/10.1147/rd.361.0059
Publikováno v:
Conference Record of the 1991 International Display Research Conference.
Thin-film-transistor (TFT) array characterization is important to liquid-crystal display (LCD) design, development, failure analysis, and sorting on a manufacturing line. The authors present characterization highlights obtained using a TFT array test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7fed8393388e214fc194548efd982427
https://doi.org/10.1109/displ.1991.167477
https://doi.org/10.1109/displ.1991.167477
Autor:
M. Kodate, Michael Mastro, T. Iwami, Tomoyuki Taguchi, Yoshinori Mekata, Leslie Charles Jenkins, Robert J. Polastre, Frank R. Libsch
Publikováno v:
SID Symposium Digest of Technical Papers. 30:72
Along with the extraordinary success of low cost amorphous silicon a-Si TFT-LCDs, technical and cost effectiveness of the TFT-array test is today's focus. In this paper we discuss the current TFT-array testing status and show the next generation TFT-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7b064badbcacaf75ebdf2b6104fef45
https://doi.org/10.1889/1.1834129
https://doi.org/10.1889/1.1834129
Autor:
John L. Staples, Steven L. Wright, H. Ifill, Robert L. Wisnieff, Kevin Wilson Warren, J. Wilson, Robert Wayne Nywening, M.B. Rothwell, Eileen A. Galligan, Paul F. Greier, Paul Matthew Alt, Richard I. Kaufman, Richard A. John, Robert J. Polastre, C. G. Powell, Yue Kuo, Leslie Charles Jenkins, Evan G. Colgan, John J. Ritsko, Alphonso P. Lanzetta, Steve Millman, Peter M. Fryer, R. A. Rand, Frank R. Libsch, Shui-Chih Lien, R. Horton, Kenneth F. Latzko, W. Graham
Publikováno v:
Scopus-Elsevier
A 157-dot-per-inch, 262K-color, 10.5-in.- diagonal, 1280 × 1024 (SXGA) display has been fabricated using a six-mask process with Cu or Al-alloy thin-film gates. The combination of high resolution and gray-scale accuracy has been shown to render colo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::587421939dee7ff4411159c7147ada68
http://www.scopus.com/inward/record.url?eid=2-s2.0-0032068579&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0032068579&partnerID=MN8TOARS
Autor:
Evan G. Colgan, Eileen A. Galligan, Peter M. Fryer, W. Graham, Yue Kuo, Robert L. Wisnieff, Steven L. Wright, Leslie Charles Jenkins, D. Hunt, J. Wilson, Robert Wayne Nywening, M. E. Rothwell, R. Horton, Robert J. Polastre, A. Lien, Kenneth F. Latzko, Richard A. John, P. Koke, Frank R. Libsch
Publikováno v:
Scopus-Elsevier
— A novel reduced mask process is used to fabricate high-resolution high-aperture-ratio 10.5-in. SXGA (1280 × 1024) displays. The process uses copper gate-metallurgy with redundancy, without the need for extra processing steps. The resulting displ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::462c4c981906ac9bd2d03c3cced911ad
http://www.scopus.com/inward/record.url?eid=2-s2.0-0030682561&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0030682561&partnerID=MN8TOARS