Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Leonard R. Lamberson"'
Publikováno v:
International Journal of Modelling and Simulation. 30:479-482
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69862d4ce11d1497e49be70fbaed332d
https://doi.org/10.1080/02286203.2010.11442609
https://doi.org/10.1080/02286203.2010.11442609
Publikováno v:
International Journal of Production Research. 39:727-736
The monitoring of production line availability on a day-to-day basis and for continuous improvement is approached from a control charting point of view. Control limits are developed along with the length of time between monitoring periods to control
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd62a146d1dc6d7dc29b0a507fc6e28b
https://doi.org/10.1080/0020754001005097
https://doi.org/10.1080/0020754001005097
Publikováno v:
IIE Transactions. 27:311-320
The Weibull distribution is widely used as a failure model, particularly for mechanical components. This distribution is rich in shape and requires a fairly large sample size to produce accurate statistical estimators, particularly for the lower perc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22b983a01032a7751b4438b7ea5d59bf
https://doi.org/10.1080/07408179508936746
https://doi.org/10.1080/07408179508936746
Autor:
Leonard R. Lamberson, Jiajun Shao
Publikováno v:
Microelectronics Reliability. 31:123-131
This paper considers some new variations when the Built-In-Test technique is applied to k -out-of- n :G systems. A complete Markov model for the reliability and availability analysis of k -out-of- n :G systems with BIT is developed. Both fault covera
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f72683e1a7d3338beb3d222703968e29
https://doi.org/10.1016/0026-2714(91)90356-c
https://doi.org/10.1016/0026-2714(91)90356-c
Autor:
Leonard R. Lamberson, Jiajun Shao
Publikováno v:
Microelectronics Reliability. 31:443-451
This paper describes some new variations when the Built-In-Test technique is applied in standby systems and develops a complete Markov model for n nonidentical unit cold standby systems with BIT. Both fault coverage and false alarm are considered. Tw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c254041a6170cec2a994e1cb90d6c2a
https://doi.org/10.1016/0026-2714(91)90230-5
https://doi.org/10.1016/0026-2714(91)90230-5
Autor:
Jiajun Shao, Leonard R. Lamberson
Publikováno v:
Reliability Engineering & System Safety. 23:219-246
This paper provides a systematic approach and summary of mathematical tools to analyze and estimate the impact of Built-In-Test (BIT) design parameters on systems reliability, availability and maintainability (RAM). Simple cases are presented to show
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::051d89e4e4ce6394e325c668126227ea
https://doi.org/10.1016/0951-8320(88)90111-1
https://doi.org/10.1016/0951-8320(88)90111-1
Autor:
Leonard R. Lamberson
Publikováno v:
A I I E Transactions. 6:327-337
The exponential distribution is frequently assumed to represent life testing data and the validity of this assumption is verified by using one of the many tests available for this situation. This paper compares the relative power of 16 of the tests a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::632f6bf685c9843583261bc48b04f5c1
https://doi.org/10.1080/05695557408974971
https://doi.org/10.1080/05695557408974971
Autor:
Kailash C. Kapur, Leonard R. Lamberson
Publikováno v:
Microelectronics Reliability. 20:75-81
This paper is concerned with the development of optimum test design strategies. Models are developed where the total cost of testing is minimized with respect to the number of items to be tested as decision variables. Models are also developed where
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e376b832a94cd0f3e6d3c900400f107b
https://doi.org/10.1016/0026-2714(80)90524-7
https://doi.org/10.1016/0026-2714(80)90524-7
Autor:
Leonard R. Lamberson
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1732416dfaadf13b341aa01d8450147f
https://doi.org/10.4271/800173
https://doi.org/10.4271/800173
Conference
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.