Zobrazeno 1 - 10
of 58
pro vyhledávání: '"Leif Scheick"'
Autor:
Tasso von Windheim, Kristin H. Gilchrist, Charles B. Parker, Stephen Hall, James B. Carlson, David Stokes, Nicholas G. Baldasaro, Charles T. Hess, Leif Scheick, Bernard Rax, Brian Stoner, Jeffrey T. Glass, Jason J. Amsden
Publikováno v:
Micromachines, Vol 14, Iss 5, p 973 (2023)
This paper demonstrates a fully integrated vacuum microelectronic NOR logic gate fabricated using microfabricated polysilicon panels oriented perpendicular to the device substrate with integrated carbon nanotube (CNT) field emission cathodes. The vac
Externí odkaz:
https://doaj.org/article/f8213e1637c845b1b071314f7c27e258
Publikováno v:
2023 IEEE Aerospace Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2247eac3bbce8846d0312ae985dbe39b
https://doi.org/10.1109/aero55745.2023.10115604
https://doi.org/10.1109/aero55745.2023.10115604
Autor:
Insoo Jun, Wousik Kim, D. O. Thorbourn, Aaron J. Kenna, Bernard G. Rax, Philippe R. Adell, Steve McClure, Leif Scheick
Publikováno v:
IEEE Transactions on Nuclear Science. 66:163-169
A total dose testing methodology for qualifying bipolar analog circuits for the Europa Clipper (EC) mission is presented. The method leverages the unique mission dose rate profile to bound device performance and reduces qualification test time from 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b14f3f4a25c1cb004c82a3072db1482
https://doi.org/10.1109/tns.2018.2886723
https://doi.org/10.1109/tns.2018.2886723
Autor:
Patrick Gevargiz, Leif Scheick, Aaron J. Kenna, Jason L. Thomas, Amanda N. Bozovich, S.S. McClure, Stephanie A. Zajac, Duc N. Nguyen, Joe Davila, Bernard G. Rax, Mitch J. Sundgaard, Kelly W. Stanford
Publikováno v:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).
We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion Laboratory in support of the Europa Clipper Mission.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8aba8a89d15ac9ad2a396876fe6c7da
https://doi.org/10.1109/redw51883.2020.9325858
https://doi.org/10.1109/redw51883.2020.9325858
Publikováno v:
IEEE Transactions on Nuclear Science. 65:719-723
A power MOSFET demonstrated destructive single-event effect (SEE) during ion irradiation in a switching circuit. Further investigation showed that the inductive load causing a spike in the drain-to-source voltage ( $V_{\text {DS}}$ ) that exceeded th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e2d65f9ee4d3b1a1923b1b8fecc7de5
https://doi.org/10.1109/tns.2017.2787499
https://doi.org/10.1109/tns.2017.2787499
Publikováno v:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
We present SEE test results for the Cobham Space Wire transceiver after dosing the device to 300 krad(Si). We performed SEU characterization with variable data rates and patterns. Events resembling SEFIs were also observed and recorded.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34e33f2dbb547109fa11fc2d106132f3
https://doi.org/10.1109/radecs45761.2018.9328695
https://doi.org/10.1109/radecs45761.2018.9328695
Autor:
Farokh Irom, Sergeh Vartanian, Leif Scheick, Gregory R. Allen, Larry D. Edmonds, S.S. McClure, Duc N. Nguyen, Kelly W. Stanford
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
We present total ionizing dose (TID) measurements of a commercial Samsung NAND flash memory intended for use on a high dose mission. Statistical variation in the first measurements necessitates a second set of measurements with an increased sample se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa3fa829c27193a529738e90abc8fd86
https://doi.org/10.1109/nsrec.2018.8584288
https://doi.org/10.1109/nsrec.2018.8584288
Autor:
Sergeh Vartanian, Leif Scheick
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
A power switch solution for a space environment using commercial off the shelf (COTS) devices is presented. The application was for a high load switch required to turn-on within 1 us that could support greater than 600 volts and current requirement o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63a85665cd566a3a6c02ec8378d81065
https://doi.org/10.1109/nsrec.2018.8584274
https://doi.org/10.1109/nsrec.2018.8584274
Autor:
Allan H. Johnston, Leif Scheick
This chapter reviews the effects of space radiation on microelectronic devices, and shows how device scaling has affected their vulnerability to radiation. The most dramatic impact has been on single-particle effects, particularly those caused by gal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9051892127de48be33ed933204911ba
https://doi.org/10.1201/b12722-2
https://doi.org/10.1201/b12722-2
Autor:
Gregory R. Allen, L. G. Pearce, Nick W. van Vonno, Leif Scheick, Sergeh Vartanian, Shirley Hart, Farokh Irom
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02cc16b7bbbe82d5c358850368bbc140
https://doi.org/10.1109/radecs.2017.8696237
https://doi.org/10.1109/radecs.2017.8696237