Thin film cavity ringdown spectroscopy and second harmonic generation on thin a-Si:H films

Autor: Aarts, I. M.P., Hoex, B., Gielis, J. J.H., Leewis, C. M., Smets, A. H.M., Engeln, R., Nesládek, M., Kessels, W. M.M., Van de Sanden, M. C.M., Abelson, J.R.

Publikováno v: Amorphous and nanocrystalline silicon-based films-2003 : symposium held April 22-25, 2003, San Francisco, California, U.S.A., 111-116
STARTPAGE=111;ENDPAGE=116;TITLE=Amorphous and nanocrystalline silicon-based films-2003 : symposium held April 22-25, 2003, San Francisco, California, U.S.A.

A set of 8 rf deposited a-Si:H thin films of various thickness (4-1031nm) have been used to explore the applicability of two optical techniques, thin film cavity ringdown spectroscopy (tf-CRDS) and second harmonic generation (SHG), for the measuremen

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https://research.tue.nl/nl/publications/0794ae19-3c66-488e-becc-6048480d6d28

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Attenuated total reflection infrared spectroscopy for studying adsorbates on planar model catalysts: CO adsorption on silica supported Rh nanoparticles.

Autor: Leewis, C. M., Kessels, W. M. M., Van de Sanden, M. C. M., Niemantsverdriet, J. W.

Publikováno v: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Mar2006, Vol. 24 Issue 2, p296-304, 9p, 2 Diagrams, 4 Graphs

Monomer diffusion assisted preparation of polymer gratings: A nuclear microprobe study

Autor: Leewis, C. M., Mutsaers, P. H., Jong, A. M. de, IJzendoorn, L. J. van, Broer, D. J., Voigt, M. J. de

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B; 2001, Vol. 181 Issue: 1 p367-371, 5p