Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Lee, Changqing"'
Publikováno v:
In Surface & Coatings Technology 2005 200(7):2547-2556
Autor:
Danon, Yron1 danoy@rpi.edu, Lee, Changqing1 leec3@rpi.edu, Mulligan, Chris2 mulligan@pica.army.mil, Vigilante, Greg2 gregvig@pica.armymil
Publikováno v:
IEEE Transactions on Magnetics. Jul2004 Part 1 of 2, Vol. 40 Issue 4, p1826-1832. 7p.
Publikováno v:
AIP Conference Proceedings; 2005, Vol. 760 Issue 1, p1721-1728, 8p
Publikováno v:
Lab on a Chip; 1/21/2017, Vol. 17 Issue 2, p203-208, 6p
Publikováno v:
Lab on a Chip; 2014, Vol. 14 Issue 20, p3899-3906, 8p
Autor:
EDFAS Organizing Committee
This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect
