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Akademický článek

Impact of Cold-Rolling and Heat Treatment on Mechanical Properties of Dual-Phase Treated Low Carbon Steel

Autor: Le Van Long, Dinh Van Hien, Nguyen Truong Thanh, Nguyen Chi Tho, Van Thom Do

Publikováno v: Advances in Materials Science and Engineering, Vol 2020 (2020)

The low carbon steel has good ductility that is favorable for forming process, but its low strength leads to limiting their application for forced structures. This paper studied improving strength of low-carbon steel via rolling deformation and dual-

Externí odkaz: https://doaj.org/article/57f5650829c44f00825d94edeb60d1da

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Akademický článek

Flexible Broadband Metamaterial Perfect Absorber Based on Graphene-Conductive Inks

Autor: Le Van Long, Nguyen Sy Khiem, Bui Son Tung, Nguyen Thanh Tung, Trinh Thi Giang, Pham Thanh Son, Bui Xuan Khuyen, Vu Dinh Lam, Liangyao Chen, Haiyu Zheng, Youngpak Lee

Publikováno v: Photonics, Vol 8, Iss 10, p 440 (2021)

In this work, we proposed a flexible broadband metamaterial perfect absorber (FBMPA) by exploiting a pasted conductive-graphene ink on a polyimide substrate. For the flat FBMPA, an absorption over 90% was found to cover a wide frequency range (from 7

Externí odkaz: https://doaj.org/article/658f45086a5044f48d2ee2dbcbf4509c

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Anisotropic Behavior of Excitons in Single Crystal {\alpha}-SnS

Autor: Le, Van Long, Cuong, Do Duc, Nguyen, Hoang Tung, Nguyen, Xuan Au, Kim, Bogyu, Kim, Kyujin, Lee, Wonjun, Hong, Soon Cheol, Kim, Tae Jung, Kim, Young Dong

We investigate analytically the anisotropic dielectric properties of single crystal {\alpha}-SnS near the fundamental absorption edge by considering atomic orbitals. Most striking is the excitonic feature in the armchair- (b-) axis direction, which i

Externí odkaz: http://arxiv.org/abs/2007.03449

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Akademický článek

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Optical Characterization of PtSi/Si by Spectroscopic Ellipsometry

Autor: Le, Van Long, Kim, Tae Jung, Park, Han Gyeol, Kim, Hwa Seob, Yoo, Chang Hyun, Kim, Hyoung Uk, Kim, Young Dong, Kim, Junsoo, Im, Solyee, Choi, Won Chul, Moon, Seung Eon, and, Eun Soo Nam

We report optical characterization of PtSi films for thermoelectric device applications by nondestructive spectroscopic ellipsometry (SE). Pt monolayer and Pt-Si multilayer which consists of 3 pairs of Pt and Si layers were deposited on p-doped-silic

Externí odkaz: http://arxiv.org/abs/1606.03767

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