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Autor:
Van Uffelen, M., Berghmans, F., Brichard, B., Vos, F., Decreton, M., Nowodzinski, A., Lecompte, J.-C., Le Neve, F., Jucker, P.
Publikováno v:
2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527); 2000, p80-84, 5p