Zobrazeno 1 - 10
of 141
pro vyhledávání: '"Lawrence T. Clark"'
Autor:
Lawrence T. Clark, Clifford S. Young-Sciortino, Steven M. Guertin, William E Brown, Keith E Holbert, Phaneendra Bikkina, Sumukh Bhanushali, Andrew Levy, Marek Turowski, Jim D. Butler
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 23:162-171
Autor:
Lawrence T. Clark, William E. Brown, Clifford S. Young-Sciortino, Jim D. Butler, Steven M. Guertin, Keith E. Holbert, Phaneendra Bikkina, Sumukh Bhanushali, Marek Turowski, Andrew Levy
Publikováno v:
IEEE Transactions on Nuclear Science. 69:2305-2313
Autor:
Lawrence T. Clark, Alen Duvnjak, Matthew Cannon, John Brunhaver, Sapan Agarwal, Jack E. Manuel, Donald Wilson, Hugh Barnaby, Matthew Marinella
Publikováno v:
IEEE Transactions on Nuclear Science. 69:1602-1609
Autor:
Sapan Agarwal, Lawrence T. Clark, Clifford Youngsciortino, Garrick Ng, Dolores Black, Matthew Cannon, Jeffrey Black, Heather Quinn, John Brunhaver, Hugh Barnaby, Jack Manuel, Ethan Blansett, Matthew J. Marinella
Publikováno v:
IEEE Transactions on Nuclear Science. 69:414-421
Autor:
Lawrence T. Clark, Clifford S. YoungSciortino, Maximilian Siath, Leonardo Martinez, William E. Brown, Shayena Khandker, Azad Derbedrosian, Sungho Kim, Ryan Melendez, Steven M. Guertin, Jean Yang-Scharlotta
Publikováno v:
2022 IEEE International Integrated Reliability Workshop (IIRW).
Autor:
Dolores A. Black, Matthew J. Marinella, Jeffrey D. Black, Micahel Skoufis, Luis Bustamante, Heather Quinn, Hugh J. Barnaby, Matthew Breeding, Sapan Agarwal, Ben Feinberg, Michael Lee McLain, Lawrence T. Clark, John Brunhaver, Arun Rodrigues, Matthew Cannon
Publikováno v:
IEEE Transactions on Nuclear Science. 68:980-990
Integration-technology feature shrink increases computing-system susceptibility to single-event effects (SEE). While modeling SEE faults will be critical, an integrated processor’s scope makes physically correct modeling computationally intractable
Autor:
A. Privat, Lawrence T. Clark, John Brunhaver, Madeline Esposito, A. Duvnjak, Hugh J. Barnaby, Matthew J. Marinella, Jack E. Manuel, Keith E. Holbert, R. Jokai, M. Spear, Michael Lee McLain, M. P. King
Publikováno v:
IEEE Transactions on Nuclear Science. 68:671-676
Total ionizing dose response of 14-nm bulk-Si FinFETs has been studied with a specially designed test chip. The radiation testing shows evidence of interface trap build-up on 14-nm Bulk FinFET technologies. These defects created in the isolation laye
Autor:
Jereme Neuendank, Matthew Spear, Trace Wallace, Donald Wilson, Jose Solano, Gedeon Irumva, Ivan Sanchez Esqueda, Hugh J. Barnaby, Lawrence T. Clark, John Brunhaver, Marek Turowski, Esko Mikkola, David Hughart, Joshua Young, Jack Manuel, Sapan Agarwal, Bastiaan Vaandrager, Gyorgy Vizkelethy, Amos Gutierrez, James Trippe, Michael King, Edward Bielejec, Matthew Marinella
Publikováno v:
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC).
Autor:
Lawrence T. Clark, Alen Duvnjak, Clifford Young-Sciortino, Matthew Cannon, John Brunhaver, Sapan Agarwal, Jereme Neuendank, Donald Wilson, Hugh Barnaby, Matthew Marinella
Publikováno v:
2022 IEEE International Symposium on Circuits and Systems (ISCAS).
Autor:
Steven M. Guertin, Lawrence T. Clark, Jean Yang-Scharlotta, Clifford S. Young-Sciortino, Jim D. Butler
Publikováno v:
2022 IEEE Aerospace Conference (AERO).