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pro vyhledávání: '"Lawrence Mudarikwa"'
Autor:
David Ockwell, Lawrence Mudarikwa, Jenny Goulden, Lei Feng, Andrew D. L. Humphris, Matthew Tedaldi
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
The Rapid Probe Microscope (RPM), exists as an integrated solution for photomask repair, with its application extended to include wafer metrology in 2016 [1]. The RPM can acquire non-destructive, high resolution, sub-nm detail in all 3 dimensions, ov
Autor:
Lois Stewart, Brian D. Westerberg, Monika Bernauer, Lawrence Mudarikwa, Irwin F. Stewart, Danuta M. Skowronski
Publikováno v:
International journal of pediatric otorhinolaryngology. 69(4)
Summary Objective: The objective of the study was to determine the prevalence of significant hearing impairment in children attending primary school in the country of Zimbabwe. Methods: A cross-sectional study of the prevalence of hearing impairment