Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Lawrence A. Casper"'
Publikováno v:
Advances in Chemistry. :xv-xviii
Autor:
Stephen A. Bourque, Lawrence E. Casper
Publikováno v:
The Journal of Military History. 65:1172
Autor:
Lance J. Agee, M. P. Paulsen, E. D. Hughes, K. R. Katsma, Clayton S. Miller, James Robert White, Richard D. Hentzen, Yoshinori Naruko, Toshihisa Ishida, Yoshimi Tanaka, Yoshiaki Futamura, A. A. Farooq Ansari, Kevin J. Burns, Douglas K. Beller, Quazi A. Haque, Stephen P. Schultz, Mario V. Bonaca, Albert Gharakhani, Richard W. Sterner, Jason Chao, V. K. (Bindi) Chexal, William H. Layman, David A. Rautmann, Craig E. Peterson, Larry W. Cress, Salvador Ranatza, T. Gary Broughton, N. G. Trikouros, Karel L. Papez, Daniel H. Risher, Michael E. Garrett, Samuel L. Forkner, T. A. Keys, George W. Perry, M. Wesley Waddell, Karl Hornyik, Joseph A. Naser, Neil M. Howard, Mitchell J. Krasnopoler, Lawrence A. Casper, Arvid M. Jensen, Kendall G. Magill, Penny M. Wikoff, William T. Li, Ching L. Wu, Osvaldo Fiorella, Manlio Mangia, Elio Oliveri
Publikováno v:
Nuclear Technology. 61:135-142
Publikováno v:
Nuclear Technology. 61:338-343
Release of fugitive organic vapors into a nuclear air cleaning system was found to result in significant lowering of the efficiency of silver zeolite filters for adsorption of iodomethane. Apparent regeneration was achieved on samples of the media th
Publikováno v:
SIL Proceedings, 1922-2010. 19:480-486
Autor:
Lawrence A. Casper
Publikováno v:
ACS Symposium Series ISBN: 9780841209343
Microelectronics Processing: Inorganic Materials Characterization
Microelectronics Processing: Inorganic Materials Characterization
Analytical Approaches and Expert Systems in the Characterization of Microelectronic Devices Electrical Characterization of Semiconductor Materials and Devices Dopant Profiles by the Spreading Resistance Technique SEM Techniques for Characterization o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d54eba129164b2514b9c0a9e8f37cf9
https://doi.org/10.1021/bk-1986-0295
https://doi.org/10.1021/bk-1986-0295
Publikováno v:
ACS Symposium Series ISBN: 9780841209343
Microelectronics Processing: Inorganic Materials Characterization
Microelectronics Processing: Inorganic Materials Characterization
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3ece21c349643e1c8305b1c954bfc14
https://doi.org/10.1021/bk-1986-0295.ch001
https://doi.org/10.1021/bk-1986-0295.ch001
Autor:
Lawrence A. Casper, Cedric J. Powell
Publikováno v:
ACS Symposium Series ISBN: 9780841207356
Industrial Applications of Surface Analysis
Industrial Applications of Surface Analysis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d83493304bd8e551e872c9b948e4d2ed
https://doi.org/10.1021/bk-1982-0199
https://doi.org/10.1021/bk-1982-0199
Autor:
LAWRENCE A. CASPER
Publikováno v:
ACS Symposium Series. :ix-x