The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components.

Autor: Zinchenko, V. F., Lavrentjev, K. V., Lipsky, A. K., Ulimov, V. N., Alexejev, N. N.

Publikováno v: 2011 12th European Conference on Radiation & Its Effects on Components & Systems; 1/ 1/2011, p734-738, 5p