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Autor:
Laurens M. Boers, Sense Jan van der Molen, Chunhai Yin, Johannes Jobst, Jan Aarts, Rudolf M. Tromp
Publikováno v:
Ultramicroscopy, 200, 43-49
For many applications, it is important to measure the local work function of a surface with high lateral resolution. Low-energy electron microscopy is regularly employed to this end since it is, in principle, very well suited as it combines high-reso
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8c9ce5ffd06f17d91bf203c928121506
