Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Laura Mont-Casellas"'
Autor:
Philippe Paillet, Olivier Marcelot, Alexandre Le Roch, Cedric Virmontois, Laura Mont Casellas, Marco Van Uffelen, Vincent Goiffon, Hugo Dewitte, Serena Rizzolo, Pierre Magnan, Jean-Marc Belloir
Publikováno v:
IEEE Transactions on Nuclear Science.
This work investigates the role of the phosphorus doping element in the radiation-induced dark current in a CMOS image sensor (CIS) photodiode. The neutron and proton irradiations on shallow arsenic-based photodiode CISs and deep phosphorus-based pho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf52d82ff1f664182e286ea4e987c33a
https://oatao.univ-toulouse.fr/26850/
https://oatao.univ-toulouse.fr/26850/
Publikováno v:
EPJ Web of Conferences, Vol 253, p 03004 (2021)
Ten samples of a custom tailored Mega-Gray hardened resolver/LVDT-to-digital converter, a resistive base sensor-to-digital converter and a RS485 communication application specific integrated circuit (ASIC) were combined in 1 irradiation campaign for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ce364d8a949b8b2465d6c3e42f9044b7
https://doi.org/10.1051/epjconf/202125303004
https://doi.org/10.1051/epjconf/202125303004
Autor:
Wouter De Cock, Marius Sergent, Sébastien Rolando, Marco Van Uffelen, Timothe Allanche, Said Bounasser, Aziouz Chabane, Vincent Goiffon, Pierre Magnan, Laura Mont Casellas, Robin Scott, Claude Marcandella, Franck Corbière, Serena Rizzolo, Olivier Marcelot, Marc Gaillardin, Magali Estribeau, Sylvain Girard, Philippe Paillet
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2018, 65 (1), pp.101-110. ⟨10.1109/TNS.2017.2765481⟩
IEEE Transactions on Nuclear Science, 2018, 65 (1), pp.101-110. ⟨10.1109/TNS.2017.2765481⟩
Total ionizing dose effects are studied on a radiation hardened by design (RHBD) $256\times 256$ -pixel CMOS image sensor (CIS) demonstrator developed for ITER remote handling by using X- and $\gamma $ -ray irradiations. The (color) imaging capabilit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e1fb54d0e2da0339b05b31fa6383370
https://ujm.hal.science/ujm-01964819
https://ujm.hal.science/ujm-01964819
Autor:
Emilio Ruiz Morales, Marco Van Uffelen, Bernhard Haist, Paul Leroux, Carlo Damiani, David Hamilton, Michiel Steyaert, Laura Mont Casellas, Jens Verbeeck, Richard Meek, Roberto Ranz Santana, Ying Cao
Publikováno v:
Fusion Engineering and Design. :1002-1005
This paper describes the radiation qualification procedure for a 1 MGy-tolerant Application Specific Integrated Circuit (ASIC) developed in 65 nm CMOS technology. The chip is intended for the read-out of electrical signals of sensors and actuators du
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45dd6a46dccd01abb63de0e70e5a86aa
https://doi.org/10.1016/j.fusengdes.2015.02.064
https://doi.org/10.1016/j.fusengdes.2015.02.064
Autor:
Sébastien Rolando, Serena Rizzolo, Marco Van Uffelen, Laura Mont Casellas, Sylvain Girard, Philippe Paillet, Robin Scott, Claude Marcandella, Wouter De Cock, Marius Sergent, Franck Corbière, Pierre Magnan, Aziouz Chabane, Vincent Goiffon
Publikováno v:
Proceedings of the Radiations Effects on Components and Systems (RADECS)
Radiations Effects on Components and Systems (RADECS)
Radiations Effects on Components and Systems (RADECS), Oct 2017, Geneva, Switzerland. pp.1-4
RADECS 2017 : Radiation and Its Effects on Components and Systems
RADECS 2017 : Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
Radiations Effects on Components and Systems (RADECS)
Radiations Effects on Components and Systems (RADECS), Oct 2017, Geneva, Switzerland. pp.1-4
RADECS 2017 : Radiation and Its Effects on Components and Systems
RADECS 2017 : Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
International audience; MOSFETs variability in irradiated CIS up to 10 MGy (SiO2) is statistically investigated on about 65000 devices. Different variability sources are identified and the role played by the transistors composing the readout chain is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e3b1c113f50cd7981e25f0e3262e100
https://hal.science/hal-02092843/file/Rizzolo_22907.pdf
https://hal.science/hal-02092843/file/Rizzolo_22907.pdf
Autor:
Wouter De Cock, Youcef Ouerdane, Timothe Allanche, Cyprien Muller, Aziz Boukenter, Marco Van Uffelen, Vincent Goiffon, Sylvain Girard, Philippe Paillet, Laura Mont-Casellas
Publikováno v:
RADECS 2017 : Radiation and Its Effects on Components and Systems
RADECS 2017 : Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1612-1618. ⟨10.1109/TNS.2017.2778318⟩
RADECS 2017 : Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1612-1618. ⟨10.1109/TNS.2017.2778318⟩
International audience; Using a dedicated setup, the growth and decay kinetics of the radiation-induced attenuation (RIA) have been characterized during and after steady-state 40-keV X-ray exposures of bulk (1-cm thickness) optical materials. Such ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::99fe2c1d147128522fd88bac82bf159f
https://hal.science/hal-01621101
https://hal.science/hal-01621101
Autor:
Marco Van Uffelen, Sébastien Rolando, Marc Gaillardin, Sylvain Girard, Timothe Allanche, Philippe Paillet, Pierre Magnan, Claude Marcandella, Vincent Goiffon, Serena Rizzolo, Laura Mont Casellas, Jérémy Baer, Magali Estribeau, Olivier Marcelot, Franck Corbière, Aziouz Chabane, Robin Scott
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.45-53. ⟨10.1109/TNS.2016.2636566⟩
IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.45-53. ⟨10.1109/TNS.2016.2636566⟩
International audience; The Total Ionizing Dose (TID) hardness of digital color Camera-on-a-Chip (CoC) building blocks is explored in the Multi-MGy range using 60Co gamma-ray irradiations. The performances of the following CoC subcomponents are studi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c04088173b90c3bcad74897533a53f68
https://oatao.univ-toulouse.fr/17619/
https://oatao.univ-toulouse.fr/17619/
Autor:
Emilio Ruiz Morales, Ying Cao, Michiel Steyaert, Carlo Damiani, Wouter De Cock, Richard Meek, Ludo Vermeeren, Marco Van Uffelen, Paul Leroux, Jens Verbeeck, Bernhard Haist, Roberto Ranz Santana, Laura Mont Casellas
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper shows a customized MGy radiation tolerant instrumentation amplifier. The 65 nm CMOS-based ASIC amplifier has an offset smaller than 1 µV and a noise level below 50 nV/√Hz from DC. It consumes less than 5 mW and has a common-mode-rejecti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d257bd46fb49c5a4913fc54e62c7931e
https://doi.org/10.1109/radecs.2015.7365579
https://doi.org/10.1109/radecs.2015.7365579
Autor:
Bernhard Haist, Carlo Damiani, Wouter De Cock, Jens Verbeeck, Ludo Vermeeren, Richard Meek, Roberto Ranz Santana, Ying Cao, Laura Mont Casellas, Marco Van Uffelen, Paul Leroux, Emilio Ruiz Morales, Michiel Steyaert
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper shows a high total dose radiation assessment on a set of space qualified components. Two space graded COTS (Commercial off-the-shelf) components were selected and monitored under 60Co gamma radiation, namely an instrumentation amplifier an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8b4c6fe84f49d0f302a86e75966c615
https://doi.org/10.1109/radecs.2015.7365633
https://doi.org/10.1109/radecs.2015.7365633
Autor:
Bernhard Haist, Ludo Vermeeren, Marco Van Uffelen, Richard Meek, Jens Verbeeck, Paul Leroux, Wouter De Cock, Carlo Damiani, Laura Mont Casellas, Roberto Ranz Santana, Michiel Steyaert, Emilio Ruiz Morales, Ying Cao
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The total-ionizing-dose (TID) radiation tolerance of CMOS temperature sensors is generally limited by the radiation-introduced leakage current in diodes. A dynamic base leakage compensation technique is employed to improve the radiation hardness of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cfde4855ade208ed51686629b7bb2785
https://doi.org/10.1109/radecs.2015.7365575
https://doi.org/10.1109/radecs.2015.7365575