Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Lauerhaas, Jeffrey"'
Publikováno v:
In Handbook of Silicon Wafer Cleaning Technology Edition: Third Edition. 2018:457-502
Autor:
Garnier, Philippe, Massin, Thomas, Chatelet, Corentin, Oghdayan, Emmanuel, Lauerhaas, Jeffrey, Morote, Carlos, Butterbaugh, Jeffery W.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; February 2021, Vol. 314 Issue: 1 p107-112, 6p
Publikováno v:
Science, 1993 Sep . 261(5128), 1567-1568.
Externí odkaz:
https://www.jstor.org/stable/2881975
Autor:
Mbanaso, Chimaobi, Butterbaugh, Jeffery W., Becker, David Scott, Printz, Wallace P., Rotondaro, Antonio L.P., Bassett, Derek W., Thomes, Gregory P., Schwab, Brent D., Rathman, Christina Ann, Lauerhaas, Jeffrey M.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; September 2016, Vol. 255 Issue: 1 p195-200, 6p
Autor:
Wallow, Thomas I., Hohle, Christoph K., Clark, Benjamin L., Kocsis, Michael, Greer, Michael, Grenville, Andrew, Saito, Takashi, Huli, Lior, Farrell, Richard, Hetzer, David, Hu, Shan, Matsumoto, Hiroie, Metz, Andrew, Kawakami, Shinchiro, Matsunaga, Koichi, Enomoto, Masashi, Lauerhaas, Jeffrey, Ratkovich, Anthony, DeKraker, David
Publikováno v:
Proceedings of SPIE; March 2015, Vol. 9425 Issue: 1 p94251A-94251A-7, 848267p
Autor:
Bakhtari, Kaveh, Bearda, Twan, Beaudoin, Stephen P., Bigman, Joel L., Brown, Brian, Busnaina, Ahmed, Chabal, Yves J., Chen, Yufei, Cui, Hua, Florescu, Doru, Gale, Glenn W., Hess, Dennis W., Hues, Steven M., Kern, Werner, Knollenberg, Brian A., Lauerhaas, Jeffrey M., Lovejoy, Luke, Mertens, Paul W., Mikhaylichenko, Katrina, Muscat, Anthony J., Paluvai, Nagarjuna R., Park, Jin-Goo, Redeker, Fritz, Reidy, Richard F., Reinhardt, Karen A., Rodier, Daniel R., Rotondaro, Antonio L.P., Rupich, Sara M., Venkatesh, R. Prasanna
Publikováno v:
In Handbook of Silicon Wafer Cleaning Technology Edition: Third Edition. 2018:xi-xi
Autor:
Sih, Vincent, Reimer, Berthold, Ratkovich, Anthony S., Lauerhaas, Jeffrey M., Butterbaugh, Jeffery W.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; September 2014, Vol. 219 Issue: 1 p93-96, 4p
Autor:
Guo, Ted, Yu, Wesley, Chien, C.C., Lin, Euing, Yang, N.H., Lin, J.F., Wu, J.Y., Ratkovich, Anthony, Kahaian, Don, Butterbaugh, Jeffery W., Lauerhaas, Jeffrey M.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; September 2014, Vol. 219 Issue: 1 p97-100, 4p
Autor:
Lauerhaas, Jeffrey M. rey.lauerhaas@fsi-intl.com
Publikováno v:
Solid State Technology. Sep2009, Vol. 52 Issue 9, p12-15. 3p.
Autor:
Yu, Bill, Huang, Stanley, Yeh, Matt, Chen, C.C., Jang, S.M., Ratkovich, Anthony, Yang, David, Lauerhaas, Jeffrey M., Butterbaugh, Jeffery W.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; December 2012, Vol. 195 Issue: 1 p46-49, 4p