Zobrazeno 1 - 10
of 154
pro vyhledávání: '"Lars Mönch"'
Autor:
Stefan Wagner, Lars Mönch
Publikováno v:
European Journal of Operational Research. 304:461-475
Autor:
John W. Fowler, Lars Mönch
Publikováno v:
European Journal of Operational Research. 298:1-24
Multiple jobs are processed simultaneously on a given batch processing machine in parallel batching. The resulting batch is called a p-batch. Batching can lead to reduced production costs, but depending how the jobs are grouped into a batch can lead
Publikováno v:
IFAC-PapersOnLine. 55:144-149
Autor:
Jens Rocholl, Lars Mönch
Publikováno v:
Metaheuristics ISBN: 9783031265037
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67baba14d7313efbc0c70a1faadc67c8
https://doi.org/10.1007/978-3-031-26504-4_48
https://doi.org/10.1007/978-3-031-26504-4_48
Autor:
Lars Mönch, Denny Kopp
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 33:511-521
In this paper, a qualification management problem arising in semiconductor wafer fabrication facilities (wafer fabs) is studied. The stepper machines, a common bottleneck in many wafer fabs, must be qualified to process lots of different families. A
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing
We present a new set of simulation models, organized in a testbed. The aim of the testbed consists in providing researchers with a platform able to credibly represent the complexity of modern semiconductor manufacturing. The testbed is open to public
Publikováno v:
Journal of Business Economics. 90:1345-1381
A bi-criteria scheduling problem for parallel identical batch processing machines in semiconductor wafer fabrication facilities is studied. Only jobs belonging to the same family can be batched together. The performance measures are the total weighte
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 33:1-12
We study the performance of production planning models for wafer fabs in a rolling horizon setting under stochastic demand modeled using the Martingale Model of Forecast Evolution (MMFE). The models differ in how they incorporate lead times and safet
Publikováno v:
IEEE Transactions on Automation Science and Engineering. 17:475-489
Machines need to be individually qualified to run lots of certain families in semiconductor wafer fabrication facilities (wafer fabs). A qualification time window that lasts a couple of days is associated with each family and each tool. The time wind
Publikováno v:
Computers & Operations Research. 149:105999