Zobrazeno 1 - 10
of 54
pro vyhledávání: '"Larry V. Kirkland"'
Publikováno v:
2019 IEEE AUTOTESTCON.
Publikováno v:
2019 IEEE AUTOTESTCON.
Publikováno v:
2018 IEEE AUTOTESTCON.
Critical weaknesses in Test Program Set (TPS) designs can be deceiving and remain unknown causing diagnostic and performance problems. These can include weak mainline test flow with intermittent pass/fails, poor diagnostics with unacceptable fault de
Publikováno v:
2018 IEEE AUTOTESTCON.
Using digital testing hardware (actual Test Equipment) and software on a defined hardware and software platform produces a means to simulate high I/O chips and chips with no model information. This is taking digital simulation to the next level. The
Autor:
R. Glenn Wright, Larry V. Kirkland
Publikováno v:
2018 IEEE AUTOTESTCON.
This paper describes a novel approach using machine learning and artificial intelligence techniques to analyze, describe and assess stimulus and sensor signal characteristics to create a robust and comprehensive description of Automatic Test Equipmen
Autor:
Larry V. Kirkland
Publikováno v:
2017 IEEE AUTOTESTCON.
It is important to allow the test engineer great flexibility when developing a test program. Highly skilled test engineers desire flexibility and different hardware platforms to test a Unit Under Test (UUT). In the past, the engineer was told to use
Autor:
Larry V. Kirkland, Cori N. McConkey
Publikováno v:
2017 IEEE AUTOTESTCON.
To utilize the proper test techniques that expand our test and diagnosis process we should regularly evaluate and integrate new devices and new techniques. Willingness to embrace change is the major requirement for successful technology integration.
Autor:
Larry V. Kirkland
Publikováno v:
2017 IEEE AUTOTESTCON.
To fully utilize the open system concept and the engineering skill of various organizations, we should utilize people who can achieve a greater understanding of diagnostic reliability. It is and has always been a fact that test engineering skill vari
Autor:
Larry V. Kirkland
Publikováno v:
2016 IEEE AUTOTESTCON.
There have been great strides in the open system plug and play concept for Automatic Test Equipment (ATE) in the Department of Defense (DoD). An ideal test system can be thought of as the sum of its parts: measurement and stimulus hardware, signal sw
Autor:
Larry V. Kirkland
Publikováno v:
2016 IEEE AUTOTESTCON.
Performing a complete and accurate desktop analysis of a Test Program Set (TPS) with all the supporting data can be an extremely exhaustive experience. True TPS transparency has plagued the world of test and diagnosis for decades. Programs managers a