Effects of Residual Surface Resistance on the Microwave Properties of YBCO Thin Films.

Autor: Porch, Adrian, Huish, David W., Velichko, Anton V., Lancaster, Mike J., Stuart Abell, J., Perry, A., Almond, D. P.

Publikováno v: IEEE Transactions on Applied Superconductivity; Jun2005 Part 3 of 3, Vol. 15 Issue 2, p3706-3709, 4p