Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Lamvik Michael"'
Autor:
Davis, J. Lynn, Mills, Karmann C., Bobashev, Georgiy, Rountree, Kelley J., Lamvik, Michael, Yaga, Robert, Johnson, Cortina
Publikováno v:
In Microelectronics Reliability May 2018 84:149-156
Autor:
Robert Yaga, Nick Baldasaro, Eric Solano, Sarah D. Shepherd, Georgiy Bobashev, J. Lynn Davis, James Bittle, Lamvik Michael
Publikováno v:
SPIE Proceedings.
Although solid-state lighting (SSL) products are often intended to have product lifetimes of 15 years or more, the rapid change in technology has created a need for accelerated life tests (ALTs) that can be performed in the span of several months. A
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f69a3ce4f8bfd4cddcd2a050558ca0b
https://doi.org/10.1117/12.2025295
https://doi.org/10.1117/12.2025295
Publikováno v:
Proceedings of SPIE; Nov2005, Issue 1, p59-67, 9p
Publikováno v:
Proceedings of SPIE; Nov2004, Issue 1, p196-204, 9p
Publikováno v:
Proceedings of SPIE; Nov2003, Issue 1, p7-14, 8p
Publikováno v:
Proceedings of SPIE; Nov2003, Issue 1, p272-279, 8p
Publikováno v:
Aerosol Science & Technology; Apr2006, Vol. 40 Issue 4, p274-281, 8p, 4 Graphs
Autor:
Jiao, Jianzhong, Davis, J. Lynn, Lamvik, Michael, Bittle, James, Shepherd, Sarah, Yaga, Robert, Baldasaro, Nick, Solano, Eric, Bobashev, Georgiy
Publikováno v:
Proceedings of SPIE; September 2013, Vol. 8835 Issue: 1 p88350L-88350L-10, 8746661p
Autor:
Lamvik, Michael K., Davilla, Scott
Publikováno v:
Journal of Electron Microscopy Technique; 1989, Vol. 11 Issue 2, p97-101, 5p
Autor:
Lamvik, Michael K., Davilla, Scott D.
Publikováno v:
Journal of Electron Microscopy Technique; 1988, Vol. 8 Issue 4, p349-354, 6p