Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Lai, W.Y.C."'
Publikováno v:
Proceedings, Sixth International IEEE VLSI Multilevel Interconnection Conference; 1989, p329-335, 7p
Autor:
Chang, C.P., Pai, C.S., Baumann, F.H., Liu, C.T., Rafferty, C.S., Pinto, M.R., Lloyd, E.J., Bude, M., Klemens, F.P., Miner, J.F., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Vaidya, H., Hillenius, S.J., Liu, R.C., Clemens, J.T.
Publikováno v:
International Electron Devices Meeting IEDM Technical Digest; 1997, p661-664, 4p
Autor:
Cheung, K.P., Martin, S., Misra, D., Steiner, K., Colonell, J.I., Chang, C.P., Lai, W.Y.C., Liu, C.T., Liu, R., Pai, C.S.
Publikováno v:
International Electron Devices Meeting IEDM Technical Digest; 1997, p437-440, 4p
Autor:
Liu, C.T., Ghetti, A., Ma, Y., Alers, G., Chang, C.P., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Pai, C.S., Liu, R., Vaidya, H., Clemens, J.T.
Publikováno v:
International Electron Devices Meeting IEDM Technical Digest; 1997, p85-88, 4p
Autor:
Liu, C.T., Ma, Y., Oh, M., Diodato, P.W., Stiles, K.R., Mcmacken, J.R., Li, F., Chang, C.P., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Liu, R., Lloyd, E.J., Miner, J.F., Pai, C.S., Vaidya, H., Frackoviak, J., Timko, A., Klemens, F., Maynard, H.
Publikováno v:
International Electron Devices Meeting 1998 Technical Digest (Cat No98CH36217); 1998, p589-592, 4p
Autor:
Ruichen Liu, Cheng-Yih Lin, Harris, E., Merchant, S., Downey, S.W., Weber, G., Ciampa, N.A., Wai Tai, Lai, W.Y.C., Morris, M.D., Bower, J.E., Miner, J.F., Frackoviak, J., Mansfield, W., Barr, D., Keller, R., Chong-Ping Chang, Chien-Shing Pai, Rogers, S.N., Gregor, R.
Publikováno v:
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407); 2000, p111-113, 3p
Autor:
Cheung, K.P., Misra, D., Colonell, J.I., Liu, C.T., Ma, Y., Chang, C.P., Lai, W.Y.C., Liu, R., Pai, C.S.
Publikováno v:
IEEE Electron Device Letters; 1998, Vol. 19 Issue 7, p231-233, 3p
Publikováno v:
IEEE Electron Device Letters; 1989, Vol. 10 Issue 12, p562-564, 3p
Autor:
Liu, C.T., Diodato, P.W., Rogers, S., Lai, W.Y.C., Chen, C.J., Lloyd, E.J., Sun, C.Y., Barr, D., Liu, R., Chang, C.P., Trimble, L., Pai, C.S., Vaidya, H.
Publikováno v:
2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104); 2000, p60-61, 2p
Autor:
Chang, C.-P., Shive, S.F., Kuehne, S.C., Ma, Y., Vuong, H., Baumann, F.H., Bude, M., Lloyd, E.J., Pai, C.S., Abdelgadir, M.A., Dail, R., Liu, C.T., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Miner, J.F., Vaidya, H., Liu, R.C., Clemens, J.T.
Publikováno v:
1999 Symposium on VLSI Technology Digest of Technical Papers (IEEE Cat No99CH36325); 1999, p161-162, 2p