Deposition of titanium oxide films by reactive High Power Impulse Magnetron Sputtering (HiPIMS): Influence of the peak current value on the transition from metallic to poisoned regimes

Autor: Nouvellon, C., Michiels, M., Dauchot, J.P., Archambeau, C., Laffineur, F., Silberberg, E., Delvaux, S., Cloots, R., Konstantinidis, S., Snyders, R.

Publikováno v: In Surface & Coatings Technology 15 April 2012 206(16):3542-3549

Impact of the anchoring groups X (–SH, –S–S–, –SeH and –Se–Se–) of CF 3(CF 2) 3(CH 2) 11X molecules self-assembled on oxidised electroplated copper

Autor: Mekhalif, Z., Fonder, G., Auguste, D., Laffineur, F., Delhalle, J.

Publikováno v: In Journal of Electroanalytical Chemistry 2008 618(1):24-32

Effect of the solvent on the formation of n-dodecanethiol films on a polycrystalline Ag90Ni10 substrate

Autor: Laffineur, F, Couturier, N, Delhalle, J, Mekhalif, Z

Publikováno v: In Applied Surface Science 15 May 2003 212-213:452-457

A new mixed organic layer for enhanced corrosion protection of electric contacts

Autor: Alamarguy, David, Noël, Sophie, Lécaudé, Nicole, Laffineur, F., Mekhalif, Z., Delhalle, J., Geribaldi, S., Guittard, F., Tortech, L., Tristani, Laurent, Di Meo, A.

Publikováno v: Proceedings of 22nd International Conference on Electrical Contact and 50th IEEE Holm Conference
22nd International Conference on Electrical Contact and 50th IEEE Holm Conference
22nd International Conference on Electrical Contact and 50th IEEE Holm Conference, 2004, United States. pp.CD-ROM

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::467f26ec451b790424d24a608a99e9c1
https://hal-supelec.archives-ouvertes.fr/hal-00320175

A new mixed organic layer for enhanced corrosion protection of electric contacts.

Autor: Noel, S., Lecaude, N., Alamarguy, D., Tristani, L., Laffineur, F., Mekhalif, Z., Delhalle, J., Tortech, L., Geribaldi, S., Guittard, F., Di Meo, A., Gavezotti, P.

Publikováno v: Proceedings of the 50th IEEE Holm Conference on Electrical Contacts & the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004; 2004, p274-280, 7p