Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals

Autor: Beutier, G., Verdier, M., De Boissieu, M., Gilles, B., Livet, F., Richard, M. -I., Cornelius, T. W., Labat, S., Thomas, O.

Publikováno v: Journal of Physics: Conference Series 425 (2013) 2003

Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements of plastic deformation in a copper crystal of sub-micron size obtained

Externí odkaz: http://arxiv.org/abs/1305.7013

Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction

Autor: Vianne, B., Escoubas, S., Richard, M.-I., Labat, S., Chahine, G., Schülli, T., Farcy, A., Bar, P., Fiori, V., Thomas, O.

Publikováno v: In Microelectronic Engineering 2 April 2015 137:117-123

Structural evolution of nanoparticles under realistic conditions observed with Bragg coherent X-ray imaging

Autor: Richard, M.I., Dupraz, M., Chatelier, C., Atlan, C., Bellec, E., Li, N., Labat, S., Schülli, T., Rabkin, E., Thomas, O., Eymery, J., Leake, S.

Publikováno v: Acta Crystallographica Section A : Foundations and Advances [2014-...]
Acta Crystallographica Section A : Foundations and Advances [2014-..], 78 (a2), pp.e94-e94, 2022, ⟨10.1107/S2053273322095869⟩

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf3ec73eabe0eb8e9333674ca17244f8
https://hal-cea.archives-ouvertes.fr/cea-04066378

Stress measurements in tungsten coated through silicon vias for 3D integration

Autor: Krauss, C., Labat, S., Escoubas, S., Thomas, O., Carniello, S., Teva, J., Schrank, F.

Publikováno v: In Thin Solid Films 1 March 2013 530:91-95

Vertical distribution of HTO and 125I− transport parameters in Boom Clay in the Essen-1 borehole (Mol, Belgium)

Autor: Aertsens, M., Maes, N., Labat, S., Van Gompel, M., Maes, T.

Publikováno v: In Physics and Chemistry of the Earth 2013 65:90-97