Zobrazeno 1 - 8
of 8
pro vyhledávání: '"LIM, V. S. W."'
Publikováno v:
International Journal of Nanoscience; Aug2005, Vol. 4 Issue 4, p709-715, 7p, 3 Graphs
Publikováno v:
Applied Physics Letters; 4/11/2005, Vol. 86 Issue 15, p152110, 3p, 4 Graphs
Publikováno v:
Applied Physics Letters; 10/4/2004, Vol. 85 Issue 14, p2941-2943, 3p, 3 Diagrams, 1 Graph
Publikováno v:
Nanotechnology; 2/7/2014, Vol. 25 Issue 5, p055703-055709, 7p
Autor:
Kavin V I Sivaneri, Ozcan Ozmen, Mina Aziziha, Edward M Sabolsky, Thomas H Evans, David B DeVallance, Matthew B Johnson
Publikováno v:
Smart Materials & Structures; Feb2019, Vol. 28 Issue 2, p1-1, 1p
Autor:
Ishii, Masashi
Publikováno v:
Journal of Physics: Condensed Matter; 5/5/2010, Vol. 22 Issue 17, p1-1, 1p
Autor:
Cai Shen
Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience resear
Autor:
A.G. Cullis, P.A. Midgley
Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microsco