Ultrasonic measurement of gas pressure and composition for nuclear fuel rods

Autor: Rosenkrantz, Eric, Ferrandis, Jean-Yves, Leveque, Gérard, Baron, Daniel

Publikováno v: In Nuclear Inst. and Methods in Physics Research, A 2009 603(3):504-509

Finite Element Modelling of AFM cantilevers

Autor: Arinero, Richard, Leveque, Gérard

Publikováno v: in Acoustic Scanning Probe Microscopy (NanoScience and Technology), Ed. Francesco Marinello, Daniele Passeri and Enrico Savio, Springer (Springer Science+Business Media Physics Editorial IV), ISBN: 978-3-642-27493-0

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dbf4cbccf09aff8963d2d5da6f2b517e
https://hal.archives-ouvertes.fr/hal-01791131

Spectroscopie diélectrique par Microscopie à force électrostatique : application à l’étude de la dynamique des polymères nanostructurés

Autor: Riedel, Clément, Arinero, Richard, LEVEQUE, Gérard, Tordjeman, Philippe, Ramonda, Michel, Schwartz, Gustavo Ariel, Alegría, Angel, Colmenero, Juan

Publikováno v: Forum des microscopies à sondes locales
Forum des microscopies à sondes locales, Mar 2011, Ecully, France

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9d806cb377a88fbb86b4fea0a913a63e
https://hal.archives-ouvertes.fr/hal-01815426

Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy

Autor: ARINERO, Richard, Riedel, C., Schwartz, Gustavo A., LEVEQUE, Gérard, Alegria, A., Tordjeman, Philippe, Israeloff, N. E., Ramonda, Michel, Colmenero, J.

Publikováno v: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). A. Méndez-Vilas and J. Díaz (Eds.)p 1963-1977
Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). A. Méndez-Vilas and J. Díaz (Eds.) p 1963-1977, 2010, 978-84-614-6191-2

Several electrostatic force microscopy (EFM) - based methods have been recently developed to study the nanoscale dielectric properties of thin insulating layers. Some methods allow measuring quantitatively the static dielectric permittivity whereas s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::aa08d01634be6f616499aed0adb5efff
https://hal.archives-ouvertes.fr/hal-01791128

Quantitative determination of the local dielectric permittivity of ultrathin films at Nanoscale by means of Electrostatic Force Microscopy

Autor: Riedel , Clément, Arinero , Richard, Tordjeman , Philippe, Schwartz , Gustavo Ariel, De Oteyza , D. G., Alegría , Angel, Ramonda , Michel, Colmenero , Juan, LEVEQUE , Gérard

Publikováno v: XI International Scanning Probe Microscopy Conference
XI International Scanning Probe Microscopy Conference, Jun 2009, Madrid, Spain

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::0022cac6d2c582165f854785c53f44d1
https://hal.archives-ouvertes.fr/hal-01814008