Zobrazeno 1 - 1
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pro vyhledávání: '"LD5655.V856 1988.C567"'
Autor:
Choquette, Steven Joseph
Attenuated total reflection techniques have been used extensively as analytical tools for the analysis of thin films and analytes imbedded in complex scattering matrices. However they have not been commonly utilized as detectors in common analytical
Externí odkaz:
http://hdl.handle.net/10919/53932
