Zobrazeno 1 - 10
of 86
pro vyhledávání: '"L.V. Kirkland"'
Autor:
L.V. Kirkland, R.G. Wright
Publikováno v:
IEEE Aerospace and Electronic Systems Magazine. 18:9-13
Unique research efforts relating to the development of nanoscale devices to replace standard integrated circuits, and eventually entire electronic systems. Standard integrated circuits (IC) have limitations or restrictions in size, speed, reliability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c5031ffc91426d3689f39d24eb679440
https://doi.org/10.1109/maes.2003.1194083
https://doi.org/10.1109/maes.2003.1194083
Autor:
R.G. Wright, L.V. Kirkland
Publikováno v:
IEEE Aerospace and Electronic Systems Magazine. 12:36-40
This paper discusses using neural networks for diagnosing circuit faults. As a circuit is tested, the output signals from a Unit Under Test can vary as different functions are invoked by the test. When plotted against time, these signals create a cha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f01556d53d285e219003bf89bbb18c3c
https://doi.org/10.1109/62.609531
https://doi.org/10.1109/62.609531
Autor:
J.S. Dean, L.V. Kirkland
Publikováno v:
IEEE Aerospace and Electronic Systems Magazine. 10:14-18
A discussion of the current and emerging core technologies and philosophies that will enable Air Force personnel to quickly, accurately and intuitively diagnose faults in increasingly complex systems. >
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::926b5f027882421e9d19690c1d3854af
https://doi.org/10.1109/62.370464
https://doi.org/10.1109/62.370464
Unraveling the Cannot Duplicate and Retest OK problems by utilizing physics in testing and diagnoses
Autor:
L.Y. Ungar, L.V. Kirkland
Publikováno v:
2008 IEEE AUTOTESTCON.
Automatic Test Equipment (ATE) has been traditionally tasked with supporting field returns. This task includes verification of proper operation and in the alternative to diagnose and provide repair instructions. While ATE has done reasonably well to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::986067fb254ad6e3ac4e9d7729e39ec6
https://doi.org/10.1109/autest.2008.4662678
https://doi.org/10.1109/autest.2008.4662678
Autor:
L.V. Kirkland, C. Carlson
Publikováno v:
2008 IEEE AUTOTESTCON.
The test executivepsilas primary purpose is to control the flow of testing on a given piece of automated test equipment. It accomplishes this by loading and executing a test programpsilas compiled executable code. Code execution enables the test exec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec074e00ff6b8fd87d2f9dbf025e1eb3
https://doi.org/10.1109/autest.2008.4662607
https://doi.org/10.1109/autest.2008.4662607
Autor:
R.G. Wright, L.V. Kirkland
Publikováno v:
IEEE Autotestcon, 2005..
This paper describes a promising new approach for testing printed circuit boards that can greatly streamline the process through which test program sets (TPSs) are developed, and enhance their ability to detect catastrophic, marginal, and pending fai
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f11efbafb013d44718001841b8447d2a
https://doi.org/10.1109/autest.2005.1609231
https://doi.org/10.1109/autest.2005.1609231
Publikováno v:
Proceedings AUTOTESTCON 2004..
This paper describes the use of multiple go-path measurements, in combination with algorithmic test sequences, to aid in improving test efficiency and accuracy and diagnostics. As an electronic device or circuit is tested, the output of the unit unde
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2767d3e6aac7f882d3d1f6a33c901c2a
https://doi.org/10.1109/autest.2004.1436872
https://doi.org/10.1109/autest.2004.1436872
Autor:
R.G. Wright, L.V. Kirkland
Publikováno v:
2003 IEEE Aerospace Conference Proceedings (Cat. No.03TH8652).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0adda1cae117fc91bde6497224e54fb4
https://doi.org/10.1109/aero.2003.1235181
https://doi.org/10.1109/aero.2003.1235181
Autor:
R.A. Lessman, L.V. Kirkland
Publikováno v:
Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference..
Utilizing engineering skill, a USAF depot repair facility was enhanced for long term support. This was accomplished by updating a recent automatic test equipment (ATE) design, building new interface test adapters (ITAs), and rehosting existing test p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::642a68c645a515cc70643cbfca6fd921
https://doi.org/10.1109/autest.2003.1243599
https://doi.org/10.1109/autest.2003.1243599
Autor:
R.G. Wright, L.V. Kirkland
Publikováno v:
Proceedings, IEEE AUTOTESTCON.
This paper describes unique research efforts relating to the development of nanoscale devices to replace standard integrated circuits, and eventually entire electronic systems. Standard integrated circuits (IC) have limitations or restrictions in siz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be1ddf2cd88747cee3fe844bd1fc599f
https://doi.org/10.1109/autest.2002.1047958
https://doi.org/10.1109/autest.2002.1047958