Zobrazeno 1 - 10
of 135
pro vyhledávání: '"L.A. Giannuzzi"'
Publikováno v:
Journal of Alloys and Compounds. 910:164918
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::280bae4d6db19829bf169209f0c0f985
https://doi.org/10.1016/j.jallcom.2022.164918
https://doi.org/10.1016/j.jallcom.2022.164918
Akademický článek
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Autor:
V.L. Panchenko, V.I. Pastukhov, I.А. Portnykh, L.A. Giannuzzi, F.А. Garner, Paula D. Freyer, S.А. Аverin
Publikováno v:
Journal of Nuclear Materials. 480:289-300
It is shown that with proper optimization, backscattered electrons in a scanning electron microscope can produce images of cavity distribution in austenitic steels over a large specimen surface for a depth of ∼500–700 nm, eliminating the need for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf00f08d8027b17f9e57638b61050636
https://doi.org/10.1016/j.jnucmat.2016.07.059
https://doi.org/10.1016/j.jnucmat.2016.07.059
Akademický článek
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Publikováno v:
Materials Characterization. 53:335-360
Planar and cross-section light optical and transmission electron microscopy (TEM) and X-ray diffraction analysis have been used to characterize the technologically relevant thin copper films and foils. The grain structure and grain orientation of (i)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42e1fac5225620377db32d0b00e1a53f
https://doi.org/10.1016/j.matchar.2004.07.013
https://doi.org/10.1016/j.matchar.2004.07.013
Publikováno v:
Surface and Coatings Technology. :121-130
Phase constituents, morphology and microstructure of thermally grown oxide (TGO) as a function of electron beam physical vapor deposition (EP-PVD) time, (Ni,Pt)Al bondcoat surface treatment and subsequent oxidation in air were examined for a series o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2025565865963450fbb2391a1bb185a7
https://doi.org/10.1016/j.surfcoat.2003.08.072
https://doi.org/10.1016/j.surfcoat.2003.08.072
Electrical linewidth test structures patterned in [100] silicon-on-insulator for use as CD standards
Autor:
Michael W. Cresswell, S.C. Everist, J.E. Bonevich, Christine E. Murabito, Loren W. Linholm, L.A. Giannuzzi, P.J. Shea, N.M.P. Guillaume, R.A. Allen
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 14:356-364
Electrical test structures known as cross-bridge resistors have been patterned in [100] epitaxial silicon material that was grown on Bonded and Etched-back Silicon-On-Insulator (BESOI) substrates. The critical dimensions (CDs) of a selection of their
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4293298314eaa4a1a3fe7aa67a0c211
https://doi.org/10.1109/66.964322
https://doi.org/10.1109/66.964322
Publikováno v:
Circuit World. 26:7-14
In this paper, we consider intrinsic properties of copper electrodeposited as plateup on polyimide substrate, thermal response of electrodeposited copper and fatigue performance of copper and copper/polyimide construction. The critical material chara
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94bafe859335a09f7f0214e5d4e62c62
https://doi.org/10.1108/03056120010378806
https://doi.org/10.1108/03056120010378806
Autor:
John R. Michael, L.A. Giannuzzi
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 19(2)
Ion channeling contrast (iCC) and electron channeling contrast (eCC) are caused by variation in signal resulting from changes in the angle of the incident beam and the crystal lattice with respect to the target. iCC is directly influenced by the inci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ab76f1c5063be8427f3166cb53ade4c1
https://pubmed.ncbi.nlm.nih.gov/23507294
https://pubmed.ncbi.nlm.nih.gov/23507294
Autor:
M. Utlaut, L.A. Giannuzzi
Publikováno v:
Ultramicroscopy. 111(11)
30 keV Ga + focused ion beam induced secondary electron (iSE) imaging was used to determine the relative contrast between several materials. The iSE signal compared from C, Si, Al, Ti, Cr, Ni, Cu, Mo, Ag, and W metal layers does not decrease with an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b95222b264ff868b4aebe902e5947bc
https://pubmed.ncbi.nlm.nih.gov/21939622
https://pubmed.ncbi.nlm.nih.gov/21939622