Zobrazeno 1 - 10
of 89
pro vyhledávání: '"L. Zanaveskin"'
Autor:
G. Dmitriev, L. Zanaveskin
Publikováno v:
Chemical Engineering Transactions, Vol 24 (2011)
Abstract preview not available - see full-text PDF article.
Externí odkaz:
https://doaj.org/article/f7f5195a2d734dfd917aee27fa330a38
Autor:
L. L. Lev, I. O. Maiboroda, E. S. Grichuk, N. K. Chumakov, N. B. M. Schröter, M.-A. Husanu, T. Schmitt, G. Aeppli, M. L. Zanaveskin, V. G. Valeyev, V. N. Strocov
Publikováno v:
Physical Review Research, Vol 4, Iss 1, p 013183 (2022)
Band bending at semiconductor surfaces and interfaces is the key to applications ranging from classical transistors to topological quantum computing. A semiconductor particularly important for optical as well as microwave devices is GaN. What makes t
Externí odkaz:
https://doaj.org/article/4e91a7d66a564861aae5c4caa751f3cf
Autor:
K. L. Zanaveskin
Publikováno v:
Tsvetnye Metally. :41-49
Publikováno v:
Crystallography Reports. 67:712-716
Autor:
K. L. Zanaveskin
Publikováno v:
Tsvetnye Metally. :45-55
Publikováno v:
Kinetics and Catalysis. 62:798-811
Autor:
I. S. Ezubchenko, M. Ya. Chernykh, P. A. Perminov, J. V. Grishchenko, I. N. Trun’kin, I. A. Chernykh, M. L. Zanaveskin
Publikováno v:
Technical Physics Letters. 47:705-708
Autor:
Anna N, Matsukatova, Aleksandr I, Iliasov, Kristina E, Nikiruy, Elena V, Kukueva, Aleksandr L, Vasiliev, Boris V, Goncharov, Aleksandr V, Sitnikov, Maxim L, Zanaveskin, Aleksandr S, Bugaev, Vyacheslav A, Demin, Vladimir V, Rylkov, Andrey V, Emelyanov
Publikováno v:
Nanomaterials (Basel, Switzerland). 12(19)
Convolutional neural networks (CNNs) have been widely used in image recognition and processing tasks. Memristor-based CNNs accumulate the advantages of emerging memristive devices, such as nanometer critical dimensions, low power consumption, and fun
Autor:
I. O. Mayboroda, Yu. V. Grishchenko, N. K. Chumakov, M. L. Zanaveskin, E. M. Kolobkova, I. A. Chernykh
Publikováno v:
Crystallography Reports. 66:520-524
The formation of β-Si3N4 for subsequent growth of AlGaN and GaN heterostructures of silicon wafers has been studied. It is established that the native oxide layer protects the silicon surface from the formation of amorphous silicon nitride when heat
Autor:
I. O. Maiboroda, I. A. Chernykh, V. S. Sedov, A. S. Altakhov, A. A. Andreev, Yu. V. Grishchenko, E. M. Kolobkova, A. K. Mart’yanov, V. I. Konov, M. L. Zanaveskin
Publikováno v:
Technical Physics Letters. 47:353-356