Zobrazeno 1 - 10
of 17
pro vyhledávání: '"L. Wolterbeek"'
Publikováno v:
Surface science, 180(2-3), 565-598. Elsevier
This paper describes a study concerning the interaction of molecular oxygen (O2) and nitrous oxide (N2O) with the clean Si(100) 2 × 1 surface in ultrahigh vacuum at 300 K. Differential reflectometry (DR) in the photon energy range of 1.5?4.5 eV, Aug
Publikováno v:
Journal of vacuum science and technology A: vacuum, surfaces, and films, 5(4), 1019-1023. AVS Science and Technology Society
This paper describes the interaction of a clean Si(110) surface, showing a prominent 5×1 superstructure, with N2O at 300 K in UHV. Differential reflectometry in the photon energy range 1.5-4.5 eV, Auger electron spectroscopy, and low-energy electron
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 1:1533-1538
This new shutter simply consists of a chopper wheel rotating a mere half‐millimeter away from the skimmer‐shaped diaphragm, which separates the source chamber from the flight tube. The repetition rate can be up to 104 pulses per s (width∼60 μs
Publikováno v:
Physica. 41:588-600
Impact radiation from He+ in Ne, Ar, Kr and Xe is studied in the wavelength region between 500 A and 2000 A. This work forms a continuation of the measurements between 3000 A and 6000 A, which have been published in a preceding article. There we have
Autor:
F J de Heer, L. Wolterbeek Muller
Publikováno v:
Physica. 48:345-396
An experimental study has been made of capture of an electron into an excited state by helium ions incident on helium, neon, argon, krypton and xenon in the energy range of 0.3 to 150 keV. Cross sections have been determined for capture into singlet
Publikováno v:
Physica. 31:1745-1755
A study has been made of capture of an electron into an excited state by helium ions incident on helium gas with impact energies between 5 and 100 keV. Absolute cross sections have been determined for capture into singlet and triplet He I levels with
Publikováno v:
Review of Scientific Instruments. 53:1058-1060
A differential reflectometer is described which is capable of measuring reflectivity variations down to 0.05% of those very small fractions (10−2–10−3) of the illuminated surface that are of interest, i.e., atomically stepped parts of rough or
Publikováno v:
Surface science, 152-15(Part 2), 1071-1078. Elsevier
The first-order difference in reflectivity of crystals surfaces due to the adsorption of a (sub)monolayer is calculated for crystals transparent to the incident radiation. Conditions are derived for optimizing experimental studies of both strongly an
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Akademický článek
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