Zobrazeno 1 - 10
of 78
pro vyhledávání: '"L. Wieluński"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research. 191:80-86
We compare the results of measurements of crystal distortions made by means of two techniques: a new kinematic X-ray diffraction technique and backscattering spectrometry of channeled MeV ions. Samples were 〈111〉 single-crystal gadolinium gallium
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1b026746d3abb5f035121a9ea4330c6
https://doi.org/10.1016/0029-554x(81)90987-3
https://doi.org/10.1016/0029-554x(81)90987-3
Publikováno v:
physica status solidi (a). 72:399-404
Backscattering spectrometry is used to investigate the depth dependence of NiSi atomic mixing induced by 300 keV Xe+ ions. Nickel films with thicknesses of 40, 64, 68, and 97 nm are deposited on 〈100〉 Si substrates and irradiated at various tempe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bdf464f4fb18fd50d88cb654aa057fb
https://doi.org/10.1002/pssa.2210720141
https://doi.org/10.1002/pssa.2210720141
Publikováno v:
Physica Status Solidi (a). 28:293-301
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab625828d009d79459068edbaff67a7a
https://doi.org/10.1002/pssa.2210280134
https://doi.org/10.1002/pssa.2210280134
Publikováno v:
Solar Cells. 5:81-86
The oxidation of thin (up to 3000 A) TiN layers was studied experimentally. It was found that the TiN layers transform into TiO2 with a rutile structure during heat treatment at temperatures around 500 °C in oxidizing ambient. The growth of the oxid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a2ba55c4fa0c36378baf6fd5ec6a15a
https://doi.org/10.1016/0379-6787(81)90018-1
https://doi.org/10.1016/0379-6787(81)90018-1
Publikováno v:
Nuclear Instruments and Methods. 168:323-328
A method of calculating particle trajectories in planar channels distorted by the presented. The equation of motion is solved in the harmonic oscillator potential approximation making it possible to estimate the dechannelling probability of initially
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9127ee94d4d6da497c753586710fef4c
https://doi.org/10.1016/0029-554x(80)91273-2
https://doi.org/10.1016/0029-554x(80)91273-2
Publikováno v:
Physica Status Solidi (a). 68:45-51
A computer simulation model is used to investigate the possibility of particle penetration through distorted atomic planes and subsequent rechanneling in the neighbouring channel. It is found that such processes significantly influence the dechanneli
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92d5f3c1f597438168f775cdf5de1307
https://doi.org/10.1002/pssa.2210680106
https://doi.org/10.1002/pssa.2210680106
Autor:
S. S. Lau, L. Wieluński, R. L. Pfeffer, D. M. Scott, Robert A. Lux, M.-A. Nicolet, J. Mikkelson
Publikováno v:
Thin Solid Films. 104:227-233
We investigated the effects of thin Si 16 O 2 and Si 18 O 2 interfacial layers on Pd 2 Si formation using He + backscattering spectrometry and the 16 O(d,α) 14 N and 18 O(p, α) 15 N nuclear reactions. SiO 2 films from 10 to 50 A thick were formed o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90fa93b1cc08bdddb85467fb3d4dfbac
https://doi.org/10.1016/s0040-6090(83)80001-7
https://doi.org/10.1016/s0040-6090(83)80001-7
Publikováno v:
Physica Status Solidi (a). 27:K65-K68
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cd65e403591806849928ebd62a0cf0b
https://doi.org/10.1002/pssa.2210270248
https://doi.org/10.1002/pssa.2210270248
Publikováno v:
The International Journal of Applied Radiation and Isotopes. 26:227-232
Applications of backscattering of 1–2 MeV α-particles to the analysis of a variety of silicon structures have been investigated. This technique allows detection of medium- and heavy- mass impurities in light matrices, as well as non-destructive in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45f84274272e55e02aaf4346ff2f5bbd
https://doi.org/10.1016/0020-708x(75)90155-6
https://doi.org/10.1016/0020-708x(75)90155-6
Publikováno v:
Journal of Radioanalytical Chemistry. 31:227-234
Nuclear microanalysis has been applied for the determination of in-depth concentration profiles of nitrogen in oxy-nitrided high-speed steel. The concentration profiles were deduced from measurements of the nitrogen content, determined by means of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38d8a4079a8c5cb824658346bcde68dd
https://doi.org/10.1007/bf02516479
https://doi.org/10.1007/bf02516479