Zobrazeno 1 - 10
of 3 991
pro vyhledávání: '"L. Wessels"'
Autor:
Emily R Donahue, Alexander J Worm, Jacob L Wessels, Joseph Youtz, Lee C Bryant, Alix E Matthews, Kevin J. Krajcir, Rhett Raibley, Than J Boves
Publikováno v:
Journal of Field Ornithology, Vol 95, Iss 2, p 1 (2024)
The non-breeding season is an understudied, yet likely critical, period for many species. Understanding species’ resource requirements, and determining when limited resources and increased densities may lead to intraspecific competition and demogra
Externí odkaz:
https://doaj.org/article/93af511b24fa432695cf81881c486116
Autor:
A. Früh, A. Zdunczyk, S. Wolf, R. Mertens, P. Spindler, D. Wasilewski, N. Hecht, S. Bayerl, J. Onken, L. Wessels, K. Faust, P. Vajkoczy, P. Truckenmueller
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-9 (2023)
Abstract The altered posterior question-mark incision for decompressive hemicraniectomy (DHC) was proposed to reduce the risk of intraoperative injury of the superficial temporal artery (STA) and demonstrated a reduced rate of wound-healing disorders
Externí odkaz:
https://doaj.org/article/a06d95f3bfe64d4195bf7dd77156126d
Publikováno v:
Dialectica, 1991 Jan 01. 45(4), 327-327.
Externí odkaz:
https://www.jstor.org/stable/42969118
Autor:
Paul Szypryt, Nathan Nakamura, Daniel T. Becker, Douglas A. Bennett, Amber L. Dagel, W. Bertrand Doriese, Joseph W. Fowler, Johnathon D. Gard, J. Zachariah Harris, Gene C. Hilton, Jozsef Imrek, Edward S. Jimenez, Kurt W. Larson, Zachary H. Levine, John A. B. Mates, D. McArthur, Luis Miaja-Avila, Kelsey M. Morgan, Galen C. O'Neil, Nathan J. Ortiz, Christine G. Pappas, Daniel R. Schmidt, Kyle R. Thompson, Joel N. Ullom, Leila Vale, Michael R. Vissers, Christopher Walker, Joel C. Weber, Abigail L. Wessels, Jason W. Wheeler, Daniel S. Swetz
Publikováno v:
IEEE Transactions on Applied Superconductivity. 33:1-5
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial resolution scanning electron microscope (SEM) with a highly efficient and
Publikováno v:
Brain and Spine, Vol 1, Iss , Pp 100790- (2021)
Externí odkaz:
https://doaj.org/article/b75789b90e4743fd8eb64d800d1e0d5f
Publikováno v:
Brain and Spine, Vol 1, Iss , Pp 100368- (2021)
Externí odkaz:
https://doaj.org/article/1cb612cf3d774a179892f011a9fcee2b
Akademický článek
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Autor:
Ping Yang, Katrina Koehler, Eric G. Bowes, Enrique R. Batista, Gene C. Hilton, M. H. Carpenter, Carl D. Reintsema, Douglas A. Bennett, Daikang Yan, Johnathon D. Gard, Zachary K. Baker, Daniel S. Swetz, Michael W. Rabin, M. P. Croce, Katherine A. Schreiber, Gregory L. Wagner, Joel C. Weber, Daniel T. Becker, Daniel Schmidt, Benjamin W. Stein, Chandler M. Smith, Christopher J. Fontes, Galen C. O'Neil, Abigail L. Wessels, Joel N. Ullom, Matthew L. Handley, J. Imrek, Kelsey M. Morgan, John A. B. Mates, Daniel G. McNeel
Publikováno v:
IEEE Transactions on Applied Superconductivity. 31:1-6
The Hyperspectral X-ray Imaging (HXI) project will enable non-destructive chemical-state determination of nano-scale samples in the electron microscope for nuclear safeguards applications. To efficiently measure chemical state through electron-excite
Akademický článek
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Autor:
Edward S. Jimenez, Edward J. Garboczi, Christine G. Pappas, Joseph W. Fowler, Nathan J. Ortiz, Douglas A. Bennett, Johnathon D. Gard, Daniel Schmidt, Daniel S. Swetz, John A. B. Mates, Joel N. Ullom, J. Imrek, Kelsey M. Morgan, Amber L. Dagel, Kyle R. Thompson, Zachary H. Levine, Kurt W. Larson, Daniel R. McArthur, Carl D. Reintsema, Christopher P. Walker, Paul Szypryt, W. Bertrand Doriese, Jason W. Wheeler, Galen C. O'Neil, William J. Boone, Nathan Nakamura, Gene C. Hilton, Malcolm Durkin, V. Kotsubo, Joel C. Weber, Abigail L. Wessels, Gabriella M. Dalton
Publikováno v:
IEEE Trans Appl Supercond
Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabrication. This can be important for process development, defect analysi