Zobrazeno 1 - 7
of 7
pro vyhledávání: '"L. T. Claiborne"'
Publikováno v:
Applied Physics Letters. 82:3185-3187
Multispectral detector arrays for application in the 8–11 μm spectral band have been fabricated from GaAs/AlGaAs multiple quantum-well (MQW) materials. For efficient narrow-band coupling of the infrared radiation, three-dimensional diffractive res
Publikováno v:
Semiconductor Science and Technology. 8:S205-S210
A modified approach for epitaxial growth of HgCdTe (MCT) by isothermal vapour phase epitaxy (ISOVPE) under high hydrogen pressure is reported. The growth and anneal are carried out in a re-usable and demountable internally heated high-pressure furnac
Publikováno v:
Applied Physics Letters. 68:2846-2848
An enhanced quantum well infrared photodetector (EQWIP) with lower dark current and improved performance relative to a conventional QWIP is described. Dark current reduction and external quantum efficiency improvements are achieved by novel structura
Autor:
W.R. Smith, D.P. Morgan, Clinton S. Hartmann, J.B. Harrington, Roni Rosenfeld, J. Wooldridge, W.R. Jones, J. Burnsweig, E.A. Ash, Iain M. Mason, J.D. Holmes, E.J. Staples, S. Ludvik, C.O. Newton, Paul Lagasse, F.G. Marshall, W.R. Shreve, D.K. Winslow, R.V. Ridings, D.T. Bell, L. T. Claiborne, G.S. Kino, R. C. Williamson, J.H. Collins, A.G. Bert, G. Kantorowicz, B.J. Darby, H.M. Gerard, E.G.S. Paige, T.A. Martin, H. van de Vaart, H.J. Shaw, Peter Grant, Joseph M. White, L.R. Schissler, Henry I. Smith, B. Epsztein
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 21:307-312
Publikováno v:
Applied Physics Letters. 19:58-60
The piezoresistance effect in Si MOSFET p‐channel inversion layers is utilized for the detection of elastic surface waves. Theoretical results for detector sensitivity are described. It is shown that arrays of such detectors can be used for program
Publikováno v:
1975 Ultrasonics Symposium.
Publikováno v:
1970 International Electron Devices Meeting.
The silicon p-channel MOSFET has previously been characterized as a piezoresistive element. Since g m of the device varies with applied stress through modulation of surface-carrier mobility, it becomes of interest to examine the response of the devic